SN75C185
LOW-POWER MULTIPLE DRIVERS AND RECEIVERS
SLLS065F – AUGUST 1989 – REVISED JANUARY 2000
1POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
� Meets or Exceeds the Requirements of
TIA/EIA-232-F and ITU Recommendation
V.28
� Single Chip With Easy Interface Between
UART and Serial-Port Connector
� Less Than 9-mW Power Consumption
� Wide Driver Supply Voltage . . . 4.5 V to
13.2 V
� Driver Output Slew Rate Limited to
30 V/m s Max
� Receiver Input Hysteresis . . . 1100 mV Typ
� Push-Pull Receiver Outputs
� On-Chip Receiver 1-m s Noise Filter
� Functionally Interchangeable With Texas
Instruments SN75185
� Operates Up to 120 kbit/s Over a 3-Meter
Cable (See Application Information for
Conditions)
description
The SN75C185 is a low-power BiMOS device containing three independent drivers and five receivers that are
used to interface data terminal equipment (DTE) with data circuit-terminating equipment (DCE). Typically, the
SN75C185 replaces one SN75188 and two SN75189 devices. This device conforms to TIA/EIA-232-F. The
drivers and receivers of the SN75C185 are similar to those of the SN75C188 and SN75C189A, respectively.
The drivers have a controlled output slew rate that is limited to a maximum of 30 V/m s, and the receivers have
filters that reject input noise pulses that are shorter than 1 m s. Both these features eliminate the need for external
components.
The SN75C185 uses the low-power BiMOS technology. In most applications, the receivers contained in this
device interface to single inputs of peripheral devices such as ACEs, UARTS, or microprocessors. By using
sampling, such peripheral devices usually are insensitive to the transition times of the input signals. If this is not
the case, or for other uses, it is recommended that the SN75C185 receiver outputs be buffered by single Schmitt
input gates or single gates of the HCMOS, ALS, or 74F logic families.
The SN75C185 is characterized for operation from 0°C to 70°C.
Copyright 2000, Texas Instruments IncorporatedPRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1
2
3
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5
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7
8
9
10
20
19
18
17
16
15
14
13
12
11
VDD
RA1
RA2
RA3
DY1
DY2
RA4
DY3
RA5
VSS
VCC
RY1
RY2
RY3
DA1
DA2
RY4
DA3
RY5
GND
DW OR N PACKAGE
(TOP VIEW)
SN75C185
LOW-POWER MULTIPLE DRIVERS AND RECEIVERS
SLLS065F – AUGUST 1989 – REVISED JANUARY 2000
2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
logic symbol†
9
8
7
6
5
4
3
2
RY5
DA3
RY4
DA2
DA1
RY3
RY2
RY1
RA5
DY3
RA4
DY2
DY1
RA3
RA2
RA1
12
13
14
15
16
17
18
19
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
logic diagram (positive logic)
RY1RA1
RY2RA2
RY3RA3
DA1DY1
DA2DY2
RY4RA4
DA3DY3
RY5RA5
SN75C185
LOW-POWER MULTIPLE DRIVERS AND RECEIVERS
SLLS065F – AUGUST 1989 – REVISED JANUARY 2000
3POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
equivalent schematics of inputs and outputs
GND
Input
DA
Internal
1.4-V Ref
to GND
VSS
VDD
EQUIVALENT DRIVER INPUT EQUIVALENT DRIVER OUTPUT
GND
VSS
74 W
160 W
72 W
EQUIVALENT RECEIVER INPUT
Input
RA
3.4 kW
1.5 kW
530 k W
GND
EQUIVALENT RECEIVER OUTPUT
VCC
GND
Output
DY
Output
RY
VDD
ESD
Protection
ESD
Protection
All resistor values are nominal.
SN75C185
LOW-POWER MULTIPLE DRIVERS AND RECEIVERS
SLLS065F – AUGUST 1989 – REVISED JANUARY 2000
4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage, VDD (see Note 1) 13.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Supply voltage, VSS –13.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Supply voltage, VCC 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, VI: Driver VSS to VDD. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Receiver –30 V to 30 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output voltage range, VO: Driver VSS– 6 V to VDD + 6 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Receiver –0.3 V to VCC + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package thermal impedance, q JA (see Note 2): DW package 58°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
N package 69°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, Tstg –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltages are with respect to network GND.
2. The package thermal impedance is calculated in accordance with JESD 51.
recommended operating conditions
MIN NOM MAX UNIT
VDD 4.5 12 13.2 V
Supply voltage VSS –4.5 –12 –13.2 V
VCC 4.5 5 6 V
VI Input voltage (see Note 3)
Drivers VSS+2 VDD VVI Input voltage (see Note 3) Receivers –25 25 V
VIH High-level input voltage Drivers
2 V
VIL Low-level input voltage
Drivers
0.8 V
IOH High-level output current Receivers
–1 mA
IOL High-level output current
Receivers
3.2 mA
TA Operating free-air temperature 0 70 °C
NOTE 3: The algebraic convention, where the more positive (less negative) limit is designated as maximum, is used in this data sheet for logic
levels only, e.g., if –10 V is a maximum, the typical value is a more negative voltage.
supply currents
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
IDD Supply current from VDD
No load, VDD = 5 V, VSS = –5 V 115 200
m AIDD Supply current from VDD
,
All inputs at 2 V or 0.8 V VDD = 12 V, VSS = –12 V 115 200
m A
ISS Supply current from VSS
No load, VDD = 5 V, VSS = –5 V –115 –200
m AISS Supply current from VSS
,
All inputs at 2 V or 0.8 V VDD = 12 V, VSS = –12 V –115 –200
m A
ICC Supply current from VCC
No load VDD = 5 V, VSS = –5 V 750
m AICC Supply current from VCC All inputs at 0 or 5 V VDD = 12 V, VSS = –12 V 750
m A
SN75C185
LOW-POWER MULTIPLE DRIVERS AND RECEIVERS
SLLS065F – AUGUST 1989 – REVISED JANUARY 2000
5POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
DRIVER SECTION
electrical characteristics over operating free-air temperature range, VDD = 12 V, VSS = –12 V,
VCC = 5 V ±10% (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP† MAX UNIT
VOH High level output voltage
VIL = 0.8 V, RL = 3 k W , VDD = 5 V, VSS = –5 V 4 4.5 VVOH High-level output voltage IL
,
See Figure 1
L ,
VDD = 12 V VSS = –12 V 10 10.8
V
VOL
Low-level output voltage VIH = 0.8 V, RL = 3 k W, VDD = 5 V, VSS = –5 V –4.4 –4 VVOL
g
(see Note 3)
IH ,
See Figure 1
L ,
VDD = 12 V VSS = –12 V –10.7 –10
V
IIH High-level input current VI = 5 V, See Figure 2 1 m A
IIL Low-level input current VI = 0, See Figure 2 –1 m A
IOS(H) High-level short-circuit VI = 0.8 V,
VO = 0 or VO = VSS, 4 5 12 19 5 mAIOS(H) goutput current (see Note 4)
I ,
See FIgure 1
O O SS,
–4.5 –12 –19.5 mA
IOS(L) Low-level short-circuit VI = 2 V, VO = 0 or VO = VDD, 4 5 12 19 5 mAIOS(L) output current (see Note 4)
I ,
See Figure 1
O O DD, 4.5 12 19.5 mA
ro Output resistance
VDD = VSS = VCC = 0,
See Note 5
VO = – 2 V to 2 V, 300 400 W
† All typical values are at TA = 25 °C.
NOTES: 3. The algebraic convention, where the more positive (less negative) limit is designated as maximum, is used in this data sheet for logic
levels only, e.g., if –10 V is a maximum, the typical value is a more negative voltage.
4. Not more than one output should be shorted at one time.
5. Test conditions are those specified by TIA/EIA-232-F.
switching characteristics, VDD = 12 V, VSS = –12 V, VCC = 5 V ±10%, TA = 25°C (unless otherwise
noted) (see Figure 3)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH
Propagation delay time,
low- to high-level output (see Note 6) 1.2 3 m s
tPHL
Propagation delay time,
high- to low-level output (see Note 6) RL = 3 k W to 7 k W, CL = 15 pF 2.5 3.5 m s
tTLH Transition time, low- to high-level output 0.53 2 3.2 m s
tTHL Transition time, high- to low-level output 0.53 2 3.2 m s
tTLH Transition time, low- to high-level output (see Note 7) RL = 3 kW to 7 kW CL = 2500 pF
1 m s
tTHL Transition time, high- to low-level output (see Note 7)
RL = 3 kW to 7 kW , CL = 2500 pF 1 m s
SR Output slew rate (see Note 7) RL = 3 k W to 7 k W , CL = 15 pF 4 10 30 V/m s
NOTES: 6. tPHL and tPLH include the additional time due to on-chip slew rate and are measured at the 50% points.
7. Measured between 3-V and –3-V points of output waveform TIA/EIA-232-F conditions), and all unused inputs are tied either high
or low.
SN75C185
LOW-POWER MULTIPLE DRIVERS AND RECEIVERS
SLLS065F – AUGUST 1989 – REVISED JANUARY 2000
6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
RECEIVER SECTION
electrical characteristics over operating free-air temperature range, VDD = 12 V, VSS = –12 V,
VCC = 5 V ±10% (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP† MAX UNIT
VIT+
Positive-going input threshhold
voltage See Figure 5 1.6 2.1 2.55 V
VIT–
Negative-going input threshhold
voltage See Figure 5 0.65 1 1.25 V
Vhys
Input hysteresis voltage
(VIT+ – VIT–) 600 1100 mV
VI = 0.75 V, IOH = –20 m A, See Figure 5 and Note 8 3.5
VOH High level output voltage VI = 0.75 V,
VCC = 4.5 V 2.8 4.4 VVOH High-level output voltage VI = 0.75 V,IOH = –1 mA, VCC = 5 V 3.8 4.9
V
See Figure 5 VCC = 5.5 V 4.3 5.4
VOL Low-level output voltage VI = 3 V, IOL = 3.2 mA, See Figure 5 0.17 0.4 V
IIH High level input current
VI = 3 V 0.43 0.55 1
mAIIH High-level input current VI = 25 V 3.6 4.6 8.3
mA
IIL Low level input current
VI = –3 V –0.43 –0.55 –1
mAIIL Low-level input current VI = –25 V –3.6 –5.0 –8.3
mA
IOS(H) Short-circuit output at high level VI = 0.75 V, VO = 0, See Figure 4 –8 –15 mA
IOS(L) Short-circuit output at low level VI = VCC, VO = VCC, See Figure 4 13 25 mA
† All typical values are at TA = 25 °C.
NOTE 8: If the inputs are left unconnected, the receiver interprets this as an input low, and the receiver outputs remain in the high state.
switching characteristics, VDD = 12 V, VSS = –12 V, VCC = 5 V ±10%, TA = 25°C (unless otherwise
noted) (see Figure 6)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH Propagation delay time, low- to high-level output 3 4 m s
tPHL Propagation delay time, high- to low-level output RL = 5 kW CL = 50 pF
3 4 m s
tTLH Transition time, low- to high-level output
RL = 5 kW , CL = 50 pF 300 450 ns
tTHL Transition time, high- to low-level output 100 300 ns
tw(N) Duration of longest pulse rejected as noise (see Note 9) RL = 5 k W , CL = 50 pF 1 4 m s
NOTE 9: The receiver ignores any postive- or negative-going pulse that is less than the minimum value of tw(N) and accepts any positive- or
negative-going pulse greater than the maximum of tw(N).
SN75C185
LOW-POWER MULTIPLE DRIVERS AND RECEIVERS
SLLS065F – AUGUST 1989 – REVISED JANUARY 2000
7POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
IOS(L)
– IOS(H)
VI
VO
VDD or GND
VSS or GND
RL = 3 k W
(for VOH and VOL tests only)
Figure 1. Driver Test Circuit
for VOH, VOL, IOS(H), and IOS(L)
– IIL
IIH
VI
VI
Figure 2. Driver Test Circuit for IIH and IIL
3 V
0 V
1.5 V 1.5 VInput
tPHL tPLH
90%
50%
10%
50%
10%
90%
tTHL tTLH
VOH
VOL
TEST CIRCUIT VOLTAGE WAVEFORMS
Output
NOTES: A. CL includes probe and jig capacitance.
B. The pulse generator has the following characteristics: tw = 25 m s, PRR = 20 kHz, ZO = 50 W , tr = tf < 50 ns.
CL(see Note A)RL
Input
Output
Pulse
Generator
(See Note B)
Figure 3. Driver Test Circuit and Voltage Waveforms
SN75C185
LOW-POWER MULTIPLE DRIVERS AND RECEIVERS
SLLS065F – AUGUST 1989 – REVISED JANUARY 2000
8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
VI IOS(L)
– IOS(H)
Figure 4. Receiver Test Circuit for IOS(H) and IOS(L)
VIT, VI
IOL
VOH
–IOH
VOL
Figure 5. Receiver Test Circuit for VIT, VOH, and VOL
4 V
0 V
50% 50%Input
tPHL tPLH
90%
50%
10%
50%
10%
90%
tTHL tTLH
VOH
VOL
TEST CIRCUIT VOLTAGE WAVEFORMS
Output
NOTES: A. CL includes probe and jig capacitance.
B. The pulse generator has the following characteristics: tw = 25 m s, PRR = 20 kHz, ZO = 50 W , tr = tf < 50 ns.
Pulse
Generator
(See Note B) RL
Input
Output
CL(see Note A)
Figure 6. Receiver Propagation and Transition Times
SN75C185
LOW-POWER MULTIPLE DRIVERS AND RECEIVERS
SLLS065F – AUGUST 1989 – REVISED JANUARY 2000
9POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
APPLICATION INFORMATION
11
12
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14
15
16
17
18
19
20
GND
RY5
DA3
RY4
DA2
DA1
RY3
RY2
RY1
VCC
VSS
RA5
DY3
RA4
DY2
DY1
RA3
RA2
RA1
VDD
10
9
8
7
6
5
4
3
2
1
43
37
40
13
36
11
41
42
RI
DTR
CTS
SO
RTS
SI
DSR
DCD
R1
DTR
CTS
TX
RTS
RX
DSR
DCD
SN75C185
5 V
TL16C450
ACE
1
5
6
9
12 V
–12 V
TIA/EIA-232-F
DB9S
Connector
Figure 7. Typical Connection
The SN75C185 supports data rates up to 120 kbit/s over a 3-meter cable. Laboratory experiments show that,
with CL= 500 pF and RL = 3 k W (minimum RS-232 input resistance load), the device can support this data rate.
The 500-pF load approximates a typical 3-meter cable because the maximum RS-232 specification is 2500 pF
(or about 15 meters). Figure 8 shows the test circuit used. Temperature was varied from 0°C to 70°C for the
experiment.
NOTES: A. The pulse generator has the following characteristics: PRR = 60 kHz (120 kbit/s), ZO = 50 W .
B. VCC = 5 V, VDD = 12 V, VSS = –12 V.
CLRL
Input
Output
Pulse
Generator
(See Note A)
VSS
VCC
VDD
Figure 8. Data-Rate Test Circuit
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
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