IEEE Std 1413-2010 IEEE Standard framework for reliability prediction of hardware

���������� � �� ���� ������� � � � ��������������� ����������������������� �������������������������� ��� ������� ������������������������ �� � ���������� � ���������������� ������� ����� � ��!��"�#�� $�� %�&�' �"(�%'��))�*�+��,(�-�#�� ��#�����.)�) � � /0 Authorized licensed use limited to: Chung Shan Institute of Science and Technology. Downloaded on November 07,2012 at 09:29:05 UTC from IEEE Xplore. Restrictions apply. Authorized licensed use limited to: Chung Shan Institute of Science and Technology. Downloaded on November 07,2012 at 09:29:05 UTC from IEEE Xplore. Restrictions apply. IEEE Std 1413™-2010 (Revision of IEEE Std 1413-1998) IEEE Standard Framework for Reliability Prediction of Hardware Sponsor IEEE Reliability Standards Committee of the IEEE Reliability Society Approved 25 March 2010 IEEE-SA Standards Board Authorized licensed use limited to: Chung Shan Institute of Science and Technology. Downloaded on November 07,2012 at 09:29:05 UTC from IEEE Xplore. Restrictions apply. Acknowledgment The Reliability Prediction Standards Development Working Group is saddened at the loss of one of the driving forces behind this standard’s coordination committee. Jerry Cartwright, an IEEE member of the Minnesota Section who served on many IEEE Standards Working Groups, passed away in 2009. We acknowledge his contribution to the development of the first publication of IEEE Std 1413 and dedicate this revision to his memory. Abstract: The framework for the reliability prediction for electronic hardware is covered in this standard. This standard identifies required elements for an understandable and credible reliability prediction with information to evaluate the effective use of the prediction results. A reliability prediction generated according to this standard shall have sufficient information concerning inputs, assumptions, data sources, methodology(ies), and uncertainties so that the risk associated with using the prediction results can be considered. This document does not provide instructions for how to perform reliability prediction and does not judge methodologies. Keywords: assessment of reliability prediction, reliability, reliability prediction • The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright © 2010 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 9 April 2010. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of Electrical and Electronics Engineers, Incorporated. 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Introduction This introduction is not part of IEEE Std 1413-2010, IEEE Standard Framework for Reliability Prediction of Hardware. In May 1992, the U.S. Army Material Systems Acquisition Activity (AMSAA) and the Center for Advanced Life Cycle Engineering (CALCE)—Electronic Products and System Consortium (EPSC), University of Maryland, briefed the Army Standardization Executive, Mr. Darold Griffen, on the problems with the current reliability standards. The development of dual-use, nongovernment reliability standards, in lieu of revising Military Standards or Military Handbooks, was proposed as a means to satisfy industry and Department of Defense (DoD) administration policy. Reducing reliance on military specifications and standards later became a priority of Secretary of Defense Dr. William J. Perry. In 1993, a Process Action Team (PAT) was chartered by Deputy Under Secretary of Defense (Acquisition Reform), Ms. Colleen Preston, to address the transition of defense suppliers and contractors to commercial practices, processes, and products. The DoD PAT placed emphasis on participating with nongovernment standards bodies to jointly develop and use their standards. AMSAA and CALCE EPSC began working with the IEEE Reliability Society to initiate an IEEE reliability prediction standard. A Reliability Prediction Standards Development Working Group was formed, consisting of participants from various commercial and government agencies, both from within and outside the United States. Written approval for the Project Authorization Request (PAR) from the IEEE Standards Board was obtained 13 December 1994. The Reliability Prediction Standards Development Working Group began coordinating with the IEEE Standards Review Committee (RevCom) on developing and formatting the draft. The Working Group has been gathering and maintaining current information on the following areas: ⎯ The best electronics reliability technologies and practices ⎯ Recommendations from industry, government, and academia ⎯ The dual-use nongovernment standards initiative The Reliability Prediction Standards Development Working Group had interacted with other organizations that focus on reliability and produce nongovernment standards, including the Information Technology Association of America (ITAA) [formerly the Electronic Industries Association (EIA)], the Society of Automotive Engineers (SAE), the American Society for Quality Control (ASQC), Telcordia (formerly Bellcore), and the Institute for Environmental Sciences (IES). The Reliability Prediction Standards Development Working Group participated in meetings with these organizations and discussed the conversion of military standards to commercial national and international standards. The standardization organizations were supportive of the development of an IEEE reliability prediction standard, and participated in the development of this standard. Organizations outside the United States such as the British Telecom, Nippon Telephone and Telegraph, and CNET were also contacted and their opinions sought on the standard. In addition, personnel from these organizations participated in this development and reviewed the working documents. Their comments and contributions helped improve this standard. iv Copyright © 2010 IEEE. All rights reserved. Authorized licensed use limited to: Chung Shan Institute of Science and Technology. Downloaded on November 07,2012 at 09:29:05 UTC from IEEE Xplore. Restrictions apply. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. 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Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright © 2010 IEEE. All rights reserved. Authorized licensed use limited to: Chung Shan Institute of Science and Technology. Downloaded on November 07,2012 at 09:29:05 UTC from IEEE Xplore. Restrictions apply. vii Copyright © 2010 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the Reliability Prediction Standards Development Working Group had the following membership: Michael Pecht, Chair Louis J. Gullo, IEEE RS Standards Committee Chair and Liaison to IEEE-SA Diganta Das, IEEE RS Standards Committee Vice Chair and Final Editor Michael H. Azarian Lori Bechtold Joseph Childs Robert Deppe Jon Elerath Harold Hart Tyrone Jackson Aridaman Jain Fred Schenkelberg Jack Sherman Alan Wood Others contributors who aided in the development of this standard by providing direction and attending meetings were as follows: Michael Cushing Ken Dalton Dick Doyle Dennis Hoffman Jim McLeish Paul Shedlock The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Ali Al Awazi Chris Bagge Bakul Banerjee Hugh Barrass Lori Bechtold H. Stephen Berger Chris Brooks Antonio Cardoso Juan Carreon Joseph Childs Keith Chow Charles Cook Michael Cushing Thomas Dineen Carlo Donati Douglas Dorr Neal Dowling David Fuschi Ron Greenthaler Randall Groves Louis J. Gullo C. Guy Ajit Gwal John Harauz Michael Henry Werner Hoelzl Dennis Hoffman Robert Holibaugh Akio Iso Atsushi Ito Piotr Karocki Rameshchandra Ketharaju Yuri Khersonsky Marc Lacroix Susan Land William Lumpkins Edward Mccall Jerry Murphy Michael S. Newman William Petit Ulrich Pohl Iulian Profir Annette Reilly Robert Resuali Michael Roberts Robert Robinson Bartien Sayogo Fred Schenkelberg Stephen Schwarm Gil Shultz James E. Smith Thomas Starai Walter Struppler Marcy Stutzman Thomas Tullia Sterling Vaden M. Karen Woolf Oren Yuen Janusz Zalewski Authorized licensed use limited to: Chung Shan Institute of Science and Technology. Downloaded on November 07,2012 at 09:29:05 UTC from IEEE Xplore. Restrictions apply. When the IEEE-SA Standards Board approved this standard on 25 March 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Lorraine Patsco IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development viii Copyright © 2010 IEEE. All rights reserved. Authorized licensed use limited to: Chung Shan Institute of Science and Technology. Downloaded on November 07,2012 at 09:29:05 UTC from IEEE Xplore. Restrictions apply. Contents 1. Overview .................................................................................................................................................... 1 1.1 Scope ................................................................................................................................................... 1 1.2 Purpose ................................................................................................................................................ 2 1.3 Uses of a reliability prediction............................................................