3-Vorburger-Ted-Optical-Methods-of-Surface-Measurement-MSSFAA-10jul12

Optical Methods of Surface Measurement Ted Vorburger, Guest Researcher National Institute of Standards and Technology (NIST) Measurement Science and Standards in Forensic Firearms Analysis 2012 NIST, Gaithersburg, MD July 10, 2012 Contents • Three optical methods for measuring surface topography: – Confocal microscopy – Focus variation microscopy – Coherence scanning interferometry • For each method, will discuss: – Brief description – Documentary standard – Some strengths and limitations – Applications in firearms examinations and research • Some comparisons • Observations on possible research with these methods for firearms • Will not discuss applications of optical reflection microscopy – already widely known and used Sources • John Song, Alan Zheng, T.B. Renegar (NIST) • ISO Standards and drafts • R. Artigas, Sensofar • B. Bachrach, Intelligent Automation, Inc. • F. Helmli, Alicona • R. Krueger-Sehm, (PTB) • P. de Groot, Zygo Corp. • M. Johnson et al. (MIT) • K. Garrard et l. (NCSU) • Nanofocus • Forensic Technology Inc. • Pyramidal Technologies Note: Certain commercial equipment may be identified in this presentation in order to specify certain experimental procedures. This does not imply recommendation or endorsement by NIST, nor does it imply that the equipment are the best available for the purpose. Observation: Conventional Optical Microscopy vs. Topographic Microscopy Surface topography (roughness height variation Z (x, y)) is likely the primary effect produced by firearms on bullets and casings. Conventional Microscopy: The optical image contrast I (x, y) Is primarily a function of: -Slope, -Shadowing, -Multiple reflections -Optical properties -Illumination direction -local height variations, indirectly Topographic Microscopy, such as interferometric and confocal microscopy, can measure local height variations Z (x, y) directly, independent of illumination and shadowing effects But there are signal-to-noise issues and data dropouts Optical image I (x, y) ≠ Topography Z (x, y) From Classification of Methods for Measuring Surface Texture, ISO International Standard (IS) 25178-6 Line Profiling, Senses Z(X ) Areal Topography, Senses Z ( X , Y ) or Z ( X ) as a function of Y * Contacting Stylus, Phase Shifting Interferometry, Coherence Scanning Interferometry, Confocal Microscopy, Chromatic Probe, Structured Light and Triangulation, SEM Stereoscopy, Scanning Tunneling Microscopy, Atomic Force Microscopy, Optical Differential Profiling, Angle Resolved SEM, Focus Variation Microscopy Contacting Stylus, Phase Shifting Interferometry, Circular Interferometric Profiling,** Optical Differential Profiling Total Integrated Scatter, Angle Resolved Scatter, Parallel Plate Capacitance, Pneumatic Area-Integrating *The accuracy of Z(Y) profiling depends on the method and should be assessed for each method. **Relies on circular scanning to produce a Z() profile. Important Properties of Microscopes for Measuring Surface Topography • Vertical Resolution • Lateral Resolution What can the instruments achieve and what vertical and lateral resolutions are required to resolve important individual characteristics of bullet and cartridge case surfaces? • Maximum Measurable Slope (Slope Range) Important for measuring firing pin impressions • Cost • Speed http://www.nanofocus- ag.com/de/html/3dmicro.html Confocal Microscopy: Schematic diagram of a disk scanning confocal microscope Surface ISO Working Draft 25178-607 ISO/Technical Committee 213/ Working Group 16 Geometrical product specification (GPS) – Surface texture: Areal – Part 607: Nominal characteristics of non-contact (imaging confocal microscopy) instruments Figure B.1 – A series of confocal images through the depth of focus of a confocal microscope’s objective. Figure B.2 – Left: axial response of a single pixel along the z-direction. Right: the three dimensional surface of the series of images of B.1. Strength • Vertical resolution ≈ 3 nm Lateral resolution ≈ 1 µm (depends on the magnification and the objective, typical for an optical microscope) Limitation • Signal decreases and becomes unreliable for high surface slopes ≈ 15 ° leading to dropouts and outliers Topography image of a firing pin impression obtained with a confocal microscope From P. Murphy et al., Three-Dimensional Virtual Comparison Microscope for Bullets, http://www.forensictechnology.com/Portals/71705/docs /technote_3dvcmbullets_20100429.pdf (May, 2010) Application of Confocal Microscopy to Firearms Research Topography image of a pair of fired bullets BulletTrax-3D Forensic Technology, Inc. Focus Variation Microscopy ISO Committee Draft 25178-606 Geometrical product specification (GPS) — Surface texture: Areal — Part 606: Nominal characteristics of non- contact (focus variation) instruments, Figure A.1 Strength of Focus Variation Microscopy Ability to measure steeply sloped surfaces Firing pin impression on 9 mm cartridge case measured with focus variation. Overlay of reflectance and topography images. A Limitation of Focus Variation Microscopy Vertical resolution ≈ 100 nm Lateral resolution ≈ several pixels Table A.1 From ISO DIS 25178―606 Applications in Forensic Science • BrassTrax-3D “depth from focus (DFF)” http://www.forensictechnology.com/publications/ • Alicona Infinite Focus • See also review article by R.S. Bolton-King et al. in AFTE Journal 42 (1) , 23 (2010) Principle of Coherence Scanning Interference Microscopy aka: Vertical scanning interferometry, White light interferometry, Scanning white light interferometry, Optical coherence tomography… Scan Direction MIRAU CONFIG. ISO Draft International Standard (DIS) 25178-604 Geometrical product specification (GPS) – Surface texture: Areal – Part 604: Nominal characteristics of non-contact (coherence scanning interferometric microscopy instruments z B A (c) (b) (a) Fig. B.1 Coherence Scanning Interferometry • Strength: Vertical resolution ≈ 3 nm • Lateral resolution ≈ 1 μm, comparable to confocal microscopy • Limitation: Has difficulty with steeply sloped surfaces • Issue: Complex sensor signal D E A B Signal Height Application in Firearms Research ALIAS, from Pyramidal Technology in cooperation with Heliotis (Switzerland) -CSI with high-speed camera Topographic image of breech face and firing pin impressions. Contents • Four optical methods for measuring surface topography: – Confocal microscopy – Focus variation microscopy – Interferometry – Chromatic confocal microscopy • For each method, will discuss: – Brief description – Documentary standard – Some strengths and limitations – Applications in firearms examinations and research • Some comparisons • Observations on possible research with these methods for firearms • Will not discuss applications of optical reflection microscopy – already widely known and used Comparison of 2D Profiles of a Standard Bullet Measured by Four Techniques Stylus, Master Profile CSI Disc Scanning Confocal Microscope Laser Scanning Confocal Microscope Areal Cross Correlation of Firing Pin Impressions of Two Casing Replicas with Confocal Microscopy Profiles of a 100 nm Ra sinusoidal grating obtained with four techniques -400 -200 0 200 400 0 20 40 60 80 100 120 -400 -200 0 200 400 0 20 40 60 80 100 120 -400 -200 0 200 400 0 20 40 60 80 100 120 -400 -200 0 200 400 0 20 40 60 80 100 120 (µm) (µm) (µm) (µm) Stylus PSI WLI Confocal (nm) Stylus PSI CSI Confocal m nm Test of Confocal Microscopy: Measurement of chirped roughness standard from PTB, Germany ≈ 1 µm ≈ 2 mm Stylus Profile Confocal, 50X Confocal, 10X Other Methods Confocal chromatic probe Polaris – 3D, K. Garrard et al.,NCSU Contacting + Optical Method Gelsight, M.K. Johnson et al. MIT Concluding Observations • Calibration standards are available for testing different methods – Smooth surfaces for assessing vertical resolution – Set of periodic surfaces for testing lateral resolution – Rough surface standards for testing the algorithms – Standard bullet and cartridge case for testing capabilities to measure steep slopes and specific geometries • Would be beneficial to test vertical and lateral resolution of each method and optimize vs. needs in ballistics identification, speed, and cost → could use a standard set of cartridge cases and bullets (Tulleners-De Kinder Cartridge Cases, NIST Cartridge Cases, IAI Bullets,…) Concluding Observations • Data Fusion: How best to combine reflection microscopy and topography data quantitatively • Can apply scanning electron microscopy to obtain images with sub-micrometer resolution (Note: BKA research)