EECS240 – Spring 2010
Lecture 5: Electronic Noise
Elad Alon
Dept. of EECS
EECS240 Lecture 5 2
Electronic Noise
• Why is noise important?
• Sets minimum signals we can deal with – often sets
lower limit on power
• Signal-to-noise ratio
• Signal Power Psig ~ (VDD)2
• Noise Power Pnoise ~ kBT/C
• SNR = Psig / Pnoise
• Technology Scaling
• VDD goes down Æ lower signal
• Increase C to compensate Æ increases power
EECS240 Lecture 5 3
Types of “Noise”
• Interference
• Not “fundamental” – deterministic
• Signal coupling
• Capacitive, inductive, subtrate, etc.
• Supply noise
• Device noise
• Caused by discreteness of charge
• “fundamental” – thermal noise
• “manufacturing process related” – flicker noise
EECS240 Lecture 5 4
Noise in Amplifiers
• All amplifiers generate noise
• Comes from carrier random thermal motion and
discreteness of charge
• Noise is random
• Has to be treated statistically – can’t predict actual
value
• Deal with mean (average), variance, spectrum
EECS240 Lecture 5 5
Thermal Noise of a Resistor
• Origin: Brownian Motion
• Thermally agitated particles
• E.g. ink in water, electrons in a conductor
• Available noise power:
• Noise power in bandwidth ∆f delivered to a matched load
• Example: ∆f = 1Hz Æ PN = 4 x 10-21W = -174 dBm
• Reference: J.B. Johnson, “Thermal Agitation of Electricity
in conductors,” Phys. Rev., pp. 97-109, July 1928.
N BP k T f= ∆
EECS240 Lecture 5 6
Resistor Noise Model
2
4
n
N B
vP k T f
R
= ∆ =
2 4n Bv k TR f= ∆
Mean square noise voltage:
EECS240 Lecture 5 7
Thermal Noise
• Present in all dissipative elements
• I.e., resistors
• Independent of DC current flow
• Random fluctuations of v(t) or i(t)
• Mean is 0
• Distribution (pdf) is Gaussian
• Power spectral density is “white”
• Up to ~THz frequencies
• kBT = 4 x 10-21 J (T = 290K = 16.9oC)
• Example:
R = 1kΩ Æ 4nV/rt-Hz
1MHz bandwidth Æ σ = 4uV
2 2 44 Bn B n
k TBv k TRB i
R
= =
EECS240 Lecture 5 8
Thermal Noise in Capacitors?
EECS240 Lecture 5 9
Noise Calculations
• Noise calculations
• Instantaneous voltages add
• Power spectral densities add
• RMS voltages do NOT add
• Example: R1+R2 in series
EECS240 Lecture 5 10
Calculating Noise in Passive Networks
• Capacitors and inductors only shape spectrum:
( ) ( )∑
=
=
x
xjfsxTon
fvsHfv 22
2
2
, )( π
EECS240 Lecture 5 11
Noise in Diodes
• Shot noise
• Zero mean, Gaussian pdf, white
• Proportional to current
• Independent of temperature
• Example:
ID = 1mA Æ 17.9pA/rt-Hz
1MHz bandwidth Æ σ = 17.9nA
• Shot noise versus thermal noise
• gdiode = Id/(kbT/q)
• Thermal noise density: 4kbTgdiode = 4qId
• Shot noise half of this (current flow in 1 direction)
fqIi Dn ∆= 2
2
EECS240 Lecture 5 12
BJT Noise
fqIi
f
fIKfqIi
fTrkv
Cc
BBb
bBb
∆=
∆
+∆=
∆=
2
2
4
2
1
2
2
α
• Just like diodes: shot noise
• Collector and base noise partially correlated
• Extrinsic resistors contribute noise
• Small signal resistors (e.g., ro) don’t
• These aren’t physical resistors
EECS240 Lecture 5 13
Triode MOSFET Noise
• Channel resistance contributes thermal noise
• Channel conductance when Vds = 0:
• Device is truly a resistor when Vds = 0, so:
( )0ds ox GS thWg C V VLµ= −
2
04d dsi kTg f= ∆
EECS240 Lecture 5 14
Saturation Noise
• Noise distributed along the channel:
• For long channel model, can substitute γgm for gds0
• More correct formulation uses inversion charge in
the channel [Tsividis]
• This is what SPICE/BSIM use
2 4d mi kT g fγ= ∆
EECS240 Lecture 5 15
Thermal Noise for Short Channels
• Strong inversion Æ thermal noise
• Drain current: gds0 is what you really care about
• gm more convenient for input-referred noise
• For low field (long L), γ = 2/3 relates gm to gds
• For high field, use α to capture increase in noise
• High-field noise can be 2-3 times larger than low field
• MOS actually has intrinsic gate induced noise
(142/242 topic)
• Gate leakage Æ shot noise
EECS240 Lecture 5 16
Weak Inversion Noise
EECS240 Lecture 5 17
FET Noise Model
• Model neglects intrinsic gate noise
• BSIM3 does not directly include α
EECS240 Lecture 5 18
1/f Noise
• Flicker noise
• Kf,NMOS = 2.0 x 10-29 AF
Kf,PMOS = 3.5 x 10-30 AF
• Strongly process dependent
• Example: ID = 10µA, L = 1µm,
• Cox = 5.3fF/µm2, fhi = 1MHz
flo = 1Hz Æ σ = 722pA
flo = 1/year Æ σ = 1083pA
EECS240 Lecture 5 19
1/f Noise Corner Frequency
• Definition (MOS)
• Example:
• V* = 200mV, γ = 1
NMOS PMOS
L = 0.35µm Æ 192kHz 34kHz
L = 1.00µm Æ 24kHz 4kHz
2 2
14
4
f D f D
B r m co
ox co ox B r m
K I K If k T g f f
L C f L C k T g
γ
γ
∆
= ∆ =
2
*
2
1 1
4
8
m
D
f
g
IB r ox
f
B r ox
K
k T C L
K V
k T C L
γ
γ
=
=
EECS240 Lecture 5 20
Noise Calculations with Actives
• Method:
1) Create small-signal model
2) All inputs = 0 (linear superposition)
3) Pick output vo or io
4) For each noise source vx, ix
Calculate Hx(s) = vo(s) / vx(s) (… io, ix)
5) Total noise at output is:
• Tedious but simple …
( ) ( )∑
=
=
x
xjfsxTon
fvsHfv 22
2
2
, )( π
( ) ( )2 ,simpler notation: on T nv f S f=
EECS240 Lecture 5 21
SPICE Noise Analysis
100/1
1000/10
50/2
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