DFT基本知识

nullnullAlexander GnusinInternal Scan ConceptInternal Scan ConceptUsed to get access to all internal chip registers:Scan inputsScan outputsFunc inputsFunc outputsMuxScan DesignMuxScan DesignMuxScan: use one clock for Func and Test mode TE signal selects mode In test mode reg-to-reg combinatorial logic is bypassedTEDTICKQDDCKTITIBoundary Scan PrinciplesBoundary Scan PrinciplesIntent: Include board-level test functionality into chip-level devices Solution: Use serial shift register wrapped around the boundary of chip Operation Modes: Serial Shift mode Parallel Capture / Update modeBoundary Scan ArchitectureBoundary Scan ArchitectureBoundary registersTMS TCK TRSTTDOTDIShiftDRINClockDRSOUTUpdateDROUTSINMode ControlPCB with IEEE 1149.1 test busPCB with IEEE 1149.1 test busTDI TMS TCK TRSTTDOTMS, TCK and TRST connected in parallel TDI , TDO - sequentiallyTest Bus SignalsTest Bus SignalsTCK – Test clock, the master clock during the boundary-scan process TDI – Test Data Input, used to shift in Data or Instructions TDO – Test Data Output, used to shift out Data TMS – Test Mode Selector, used to control FSM in TAP Controller TRST – Optional TAP Controller asynchronous resetBoard and Chip Test ModesBoard and Chip Test ModesExternal Test Mode – to test board interconnect:Application LogicShiftDRINClockDRSOUTUpdateDROUTSINShiftDRINClockDRSOUTUpdateDROUTSINApplication LogicMode ControlMode ControlBoard and Chip Test Modes (Cont)Board and Chip Test Modes (Cont)Sample Test Mode: Sampling Data during normal chip operation:Application LogicShiftDRINClockDRSOUTUpdateDROUTSINMode ControlShiftDRINClockDRSOUTUpdateDROUTSINMode ControlBoard and Chip Test Modes (Cont)Board and Chip Test Modes (Cont)Internal Test Mode: drive chip inputs and capture chip outputs using boundary registers (Functional Isolation)Application LogicShiftDRINClockDRSOUTUpdateDROUTSINMode ControlShiftDRINClockDRSOUTUpdateDROUTSINMode ControlTap ControllerTap ControllerFSM of Tap Controller is controlled by only one signal, TMS:Test-Logic-ResetRun Test/IdleSelect DR-ScanSelect IR-ScanCapture-IRShift-IRExit-IRUpdate-IRCapture-IRShift-IRExit-IRUpdate-IR0111110011000000111100Tap Controller StatesTap Controller StatesTest-Logic-Reset : Boundary Scan disabled, normal functional mode Run Test/Idle : Internal BIST test runs Capture-DR : Data loaded in parallel into TDR (Test Data Register) selected by current instruction (ClockDR pulse, ShiftDR = 0) Shift-DR : Shift Data in TDR, selected by current instruction (ClockDR pulse, ShiftDR = 1) Update-DR : Update data on the output of TDR, selected by current instruction (UpdateDR pulse)ShiftDRINClockDRSOUTUpdateDROUTSINMode ControlTAP Controller InstructionsTAP Controller InstructionsBypass: to bypass current chip, when targeting the other one Highz: turns all device output off and inserts the bypass register between TDI and TDO. Clamp: the contents of the boundary register control the state of output pins while the bypass register is connected between TDI and TDO Extest : to test circuitry external to the chip (board interconnect) Sample: sample data on IO Pads into the boundary register Intest: To apply a test vector to the chip via boundary-scan path and capture logic response RunBIST: Allows self-test execution on the chip Built-in Self-Test (BIST)Built-in Self-Test (BIST)BIST - Capability of a circuit to test itself Test Pattern Generation Types: Exhaustive Testing (for n inputs, 2n tests) Pseudorandom Testing (weighted Test Generation) Pseudoexhaustive Testing (divide by logic cones and test them in parallel, but each one exhaustively) Pseudo Random Pattern Generator (PRPG) – multioutput device that generates pseudorandom output patterns (based on LFSR, Linear Feedback Shift Register) Multiple-Input Signature Register (MISR) – multi-input device that compresses a series of input patterns into unique signatureWeighted PRPGWeighted PRPGPRPG: produces pseudorandom data without replacement (all vectors are unique). Constant-Weight PRPG: probability to get “1” for each output is constant (Example : equal number of “1” and “0” in each word => weight = 0.5) PRPG can adjust weights adding combinatorial logic to the outputs: ClkClk0.50.250.75Generic LBIST ArchitectureGeneric LBIST ArchitectureFirst, PRPG issues N pseudorandom tests, where N – maximal internal scan chain length. Second, series of Functional Clock pulses is issued for DC test, the same test clock as for PRPG is used For AC test, functional clock must be provided with real frequency Third, changed data is shifted to MISR and compressed signature is created (using the same N number of test clocks)Func inputsFunc outputsPRPGMISRLBIST ControllerSignatureClkTe Test (N clocks) Func Test (N clocks)LBIST Design IssuesLBIST Design IssuesIn order to produce constant signature, we need to remove all X – sources from design: Assign constant logic value to all Primary Inputs Isolate memories (or all elements without scan chains) Isolate PLLs LBIST can be initiated and signature can be read out using user-defined instructions of TAP controller Long simulation times to produce signature – use of cycle-based simulator TPI – Test Points InsertionTPI – Test Points InsertionTwo type of test points : Control Points (CP) are Primary Inputs or Scannable Register Outputs to enhance controlability Observation Points (OP) are Primary Outputs or Scannable Register Inputs to enhance observabilityC1C1Problem: G not controlableGC1C1G’Gcp1cp2C1C1Problem: G not observableGC1C1GDScannable Register InsertionScannable Register InsertionTED=0TICKCPTEDTICKTo TI of next register onlyOPControl Point:Observation Point:Memory BISTMemory BISTEmbedded Memories use non-scannable registers – how to test them? Getting access to all memory pins from PI and PO is expensive… Better solution – add Memory BIST Controller to generate Test Patterns and to observe Test Responses from memory Two ways to add controller : Separate for each memory array (encapsulation) - less wires, more area Shared for the number of memory arrays - less area, but much more wires Memory Test is initiated using TAP ControllerRAM……Test OutTest InRAMMBISTDinDout…Logic Vision Memory BISTLogic Vision Memory BISTLogic Vision solution: reducing the number of SRAM test vectors to one:Parallel Test Vectors:Sequential Test Vectors:Pin SharingPin SharingMore internal scan chains for faster testing – more test Iopads Internal Test Scan Input/Output pads are disconnected on the board The pads number in the chip is limited. Solution: Share Functional and Test pinsShiftDRINClockDRSOUTUpdateDROUTSINMode ControlShiftDRINClockDRSOUTUpdateDROUTSINMode ControlTest ModeScan OutJTAG for functional debuggingJTAG for functional debuggingAllscan: “Freeze” the chip and get access to ALL registers data Modify Some registers data and and continue in functional mode Implementation: Serial connection of all Internal Scan chains between TDI and TDO Test Clock is produces from JTAG clock (TCK) Clocks Control – no clock glitches when “freezing” the chip SISOCore LogicTDITDOFunc ClockJTAG ClockAllscanResult ClockGlitch, can destroy data in registers