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TLP552 TLP552 2009-02-17 1 TOSHIBA Photocoupler GaAℓAs IRED & Photo IC TLP552 Isolated Line Receiver Simplex/Multiplex Data Transmission Computer-Peripheral Interface Microprocessor System Interface Digital Isolation for A-D, D-A Conversion The T...

TLP552
TLP552 2009-02-17 1 TOSHIBA Photocoupler GaAℓAs IRED & Photo IC TLP552 Isolated Line Receiver Simplex/Multiplex Data Transmission Computer-Peripheral Interface Microprocessor System Interface Digital Isolation for A-D, D-A Conversion The TOSHIBA TLP552 is a photocoupler which combines a GaAℓAs IRED LED as the emitter and an integrated high gain, high speed photodetector. This unit is 8-lead DIP. The output of the detector circuit is an open collector, schottky clamped transistor. • TTL/LSTTL compatible: VCC = 5 V • Isolation voltage: 2500 Vrms (min) • Switching speed: tpHL, tpLH = 60 ns (typ.) (@RL = 350 Ω) • Guaranteed performance over temp.: 0 to 70°C • UL recognized: UL1577, file no. E67349 Truth Table (positive logic) Input Enable Output H H L L H H H L H L L H Note: A 0.1 μF bypass capacitor must be connected between pins 8 and 5 (see "Instruction for use" on page 3). Pin Configurations (top view) Schematic Unit: mm JEDEC ⎯ JEITA ⎯ TOSHIBA 11-10C4 Weight: 0.54 g (typ.) 1: N.C. 2: Anode 3: Cathode 4: N.C. 5: GND 6: Output (open collector) 7: Enable 8: VCC 1 3 8 4 2 5 6 7 IF 3 82 5 6 VF ICC IE IO VCC 7 VE VO GND + − TLP552 2009-02-17 2 Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit Forward current IF 20 mA Pulse forward current (Note 1) IFP 40 mA Peak transient forward current (Note 2) IFPT 0.5 A Reverse voltage VR 5 V LE D Diode power dissipation PD 40 mW Output current IO 50 mA Output voltage VO 7 V Supply voltage (Note 3) VCC 7 V Enable input voltage (Note 4) VE 5.5 V D et ec to r Output collector power dissipation PO 85 mW Operating temperature range Topr 0 to 70 °C Storage temperature range Tstg −55 to 125 °C Lead solder temperature (10 s) (Note 5) Tsol 260 °C Isolation voltage (AC, 1 min., R.H. ≤ 60%) (Note 6) BVS 2500 Vrms Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: 50% duty cycle, 1 ms pulse width. Note 2: Pulse width ≤ 1μs, 300 pps. Note 3: 1 minute maximum. Note 4: Not to exceed VCC by more than 500 mV. Note 5: Soldering portion of lead: up to 2 mm from the body of the device. Note 6: Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted together. Recommended Operating Conditions Characteristics Symbol Min Typ. Max Unit Input current, low level IFL 0 ⎯ 250 μA Input current, high level IFH 7 ⎯ 20 mA Supply voltage, output VCC 4.5 ⎯ 5.5 V High level enable voltage VEH 2.0 ⎯ VCC V Low level enable voltage VEL 0 ⎯ 0.8 V Fan out (TTL load) N ⎯ ⎯ 8 ⎯ Operating temperature Topr 0 ⎯ 70 °C Note: The recommended operating conditions are given as a design guideline to obtain expected performance of the device. In addition, each item is an independent guideline. In developing designs using this product, please confirm the specified characteristics shown in this document. TLP552 2009-02-17 3 Electrical Characteristics (unless otherwise specified, for 0°C ≤ Ta ≤ 70°C) Characteristics Symbol Test Condition Min Typ. Max Unit Input forward voltage VF IF = 10 mA, Ta = 25°C ⎯ 1.65 1.8 V Input diode temperature coefficient ΔVF/ΔTa IF = 10 mA ⎯ −2.0 ⎯ mV/°C Input reverse current IR VR = 5 V, Ta = 25°C ⎯ ⎯ 10 μA Input capacitance CT VF = 0 V, f = 1 MHz, Ta = 25°C ⎯ 45 ⎯ pF High level output current IOH VCC = 5.5 V, VO = 5.5 V IF = 250 μA, VE = 2.0 V ⎯ 10 250 μA Low level output voltage VOL VCC = 5.5 V, IF = 5 mA VEH = 2.0 V, IOL = 13 mA (sinking) ⎯ 0.4 0.6 V Input current logic low output level IFH IOL = 13 mA (sinking), VO = 0.6 V, VCC = 5.5 V, VEH = 2.0 V ⎯ ⎯ 5 mA High level enable current IEH VCC = 5.5 V, VE = 2.0 V ⎯ −1.0 ⎯ mA Low level enable current IEL VCC = 5.5 V, VE = 0.5 V ⎯ −1.6 −2.0 mA High level supply current ICCH VCC = 5.5 V, IF = 0 mA, VE = 0.5 V ⎯ 7 15 mA Low level supply current ICCL VCC = 5.5 V, IF = 10 mA, VE = 0.5 V ⎯ 12 18 mA Current transfer ratio CTR IF = 5.0 mA, RL = 100 Ω VCC = 5.0 V, Ta = 25°C ⎯ 1000 ⎯ % Resistance (input-output) RS VS = 500 V, R.H. ≤ 60%, Ta = 25°C 5 × 1010 1014 ⎯ Ω Capacitance (input-output) CS VS = 0 V, f = 1 MHz, Ta = 25°C ⎯ 0.6 ⎯ pF Switching Characteristics (Ta = 25°C, VCC = 5 V) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Propagation delay time to high output level (L → H) tpLH 1 RL = 350 Ω, CL = 15 pF IF = 7.5 mA ⎯ 60 120 ns Propagation delay time to low output level (H → L) tpHL 1 RL = 350 Ω, CL = 15 pF IF = 7.5 mA ⎯ 60 120 ns Output rise fall time (10 to 90%) tr, tf 1 RL = 350 Ω, CL = 15 pF IF = 7.5 mA ⎯ 30 ⎯ ns Propagation delay time of enable from VEH to VEL tELH 2 RL = 350 Ω, CL = 15 pF IF = 7.5 mA, VEH = 3.0 V ⎯ 25 ⎯ ns Propagation delay time of enable from VEL to VEH tEHL 2 RL = 350 Ω, CL = 15 pF IF = 7.5 mA, VEH = 3.0 V ⎯ 25 ⎯ ns Common mode transient immunity at logic high output level CMH 3 VCM = 200 V, RL = 350 Ω VO (min) = 2 V, IF = 0 mA ⎯ 200 ⎯ V / μs Common mode transient immunity at logic low output level CML 3 VCM = 200 V, RL = 350 Ω VO (max) = 0.8 V, IF = 5 mA ⎯ −500 ⎯ V / μs Instruction for use 1. A ceramic capacitor (0.1 μF) should be connected from pin 8 and pin 5 to stabilize the operation of the high gain linear amplifier. Failure to provide the bypassing may impair the switching properties. The total lead length between the capacitor and coupler should not exceed 1 cm. 2. Maximum electrostatic discharge voltage for any pins: 180 V (C = 200 pF, R = 0). TLP552 2009-02-17 4 Test Circuit 1: Switching Time Test Circuit Test Circuit 2: Switching Time Test Circuit Test Circuit 3: Common Mode Noise Immunity Test Circuit CMH: The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high output state (i.e., VO > 2.0 V). Measured in volts per microsecond (V / μs). CML: The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state (i.e., VO < 0.8 V). Measured in volts per microsecond (V / μs). Pulse generator IF = 7.5 mA 5 V CL Output VO Monitoring node ZO = 50 Ω tr = 5 ns 0. 1 μF 35 0 Ω CL is approximately 15 pF which includes probe and stray wiring capacitance. VO VE tEHL 1.5 V 1.5 V VOL 5 V tELH 3 V 0 V 1.5 V Pulse generator IF 51 Ω 5 V CL Output VO Monitoring node ZO = 50 Ω tr = 5 ns Monitoring node 0. 1 μF 35 0 Ω CL is approximately 15 pF which includes probe and stray wiring capacitance. VO IF tpHL 1.5 V 1.5 V VOL 5 V tpLH 7.5 mA 0 mA 3.75 mA 0.5 V 4.5 V tr tf VCM Pulse generator ZO = 50 Ω CMH = s)(t (V)160 r μ , CML = s)(t (V)160 f μ IF 5 V CL Output VO Monitoring node 0. 1 μF 35 0 Ω VCM 0 Vtr tf 200 V90% 10% 5 V 2 V 0.8 V VO (IF = 0 mA) VO (IF = 5 mA) VOL CL is approximately 15 pF which includes probe and stray wiring capacitance. TLP552 2009-02-17 5 TLP552 2009-02-17 6 TLP552 2009-02-17 7 RESTRICTIONS ON PRODUCT USE • Toshiba Corporation, and its subsidiaries and affiliates (collectively “TOSHIBA”), reserve the right to make changes to the information in this document, and related hardware, software and systems (collectively “Product”) without notice. • This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with TOSHIBA’s written permission, reproduction is permissible only if reproduction is without alteration/omission. • Though TOSHIBA works continually to improve Product’s quality and reliability, Product can malfunction or fail. Customers are responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage to property, including data loss or corruption. Before creating and producing designs and using, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the precautions and conditions set forth in the “TOSHIBA Semiconductor Reliability Handbook” and (b) the instructions for the application that Product will be used with or for. Customers are solely responsible for all aspects of their own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications. TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS’ PRODUCT DESIGN OR APPLICATIONS. • Product is intended for use in general electronics applications (e.g., computers, personal equipment, office equipment, measuring equipment, industrial robots and home electronics appliances) or for specific applications as expressly stated in this document. Product is neither intended nor warranted for use in equipment or systems that require extraordinarily high levels of quality and/or reliability and/or a malfunction or failure of which may cause loss of human life, bodily injury, serious property damage or serious public impact (“Unintended Use”). Unintended Use includes, without limitation, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for automobiles, trains, ships and other transportation, traffic signaling equipment, equipment used to control combustions or explosions, safety devices, elevators and escalators, devices related to electric power, and equipment used in finance-related fields. Do not use Product for Unintended Use unless specifically permitted in this document. • Do not disassemble, analyze, reverse-engineer, alter, modify, translate or copy Product, whether in whole or in part. • Product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any applicable laws or regulations. • The information contained herein is presented only as guidance for Product use. No responsibility is assumed by TOSHIBA for any infringement of patents or any other intellectual property rights of third parties that may result from the use of Product. No license to any intellectual property right is granted by this document, whether express or implied, by estoppel or otherwise. • ABSENT A WRITTEN SIGNED AGREEMENT, EXCEPT AS PROVIDED IN THE RELEVANT TERMS AND CONDITIONS OF SALE FOR PRODUCT, AND TO THE MAXIMUM EXTENT ALLOWABLE BY LAW, TOSHIBA (1) ASSUMES NO LIABILITY WHATSOEVER, INCLUDING WITHOUT LIMITATION, INDIRECT, CONSEQUENTIAL, SPECIAL, OR INCIDENTAL DAMAGES OR LOSS, INCLUDING WITHOUT LIMITATION, LOSS OF PROFITS, LOSS OF OPPORTUNITIES, BUSINESS INTERRUPTION AND LOSS OF DATA, AND (2) DISCLAIMS ANY AND ALL EXPRESS OR IMPLIED WARRANTIES AND CONDITIONS RELATED TO SALE, USE OF PRODUCT, OR INFORMATION, INCLUDING WARRANTIES OR CONDITIONS OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, ACCURACY OF INFORMATION, OR NONINFRINGEMENT. • GaAs (Gallium Arsenide) is used in Product. GaAs is harmful to humans if consumed or absorbed, whether in the form of dust or vapor. Handle with care and do not break, cut, crush, grind, dissolve chemically or otherwise expose GaAs in Product. • Do not use or otherwise make available Product or related software or technology for any military purposes, including without limitation, for the design, development, use, stockpiling or manufacturing of nuclear, chemical, or biological weapons or missile technology products (mass destruction weapons). Product and related software and technology may be controlled under the Japanese Foreign Exchange and Foreign Trade Law and the U.S. Export Administration Regulations. Export and re-export of Product or related software or technology are strictly prohibited except in compliance with all applicable export laws and regulations. • Please contact your TOSHIBA sales representative for details as to environmental matters such as the RoHS compatibility of Product. Please use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances, including without limitation, the EU RoHS Directive. TOSHIBA assumes no liability for damages or losses occurring as a result of noncompliance with applicable laws and regulations. TOSHIBA Photocoupler GaAℓAs IRED & Photo IC Truth Table (positive logic) Pin Configurations (top view) Schematic Absolute Maximum Ratings (Ta  25°C) Recommended Operating Conditions Electrical Characteristics (unless otherwise specified, for 0°C ( Ta ( 70°C) Switching Characteristics (Ta  25°C, VCC  5 V) Test Circuit 1: Switching Time Test Circuit Test Circuit 2: Switching Time Test Circuit Test Circuit 3: Common Mode Noise Immunity Test Circuit
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