TLP2631

TLP2631 2007-10-01 1 TOSHIBA photocoupler GaAℓAs IRed & Photo IC TLP2631 Isolated Line Receiver Simplex / Multiplex Data Transmission Computer-Peripheral Interface Microprocessor System Iinterface Digital Isolation for A / D, D / A Conversion The TOSHIBA TLP2631 dual photocoupler consists of a pair of GaAℓAs light emitting diode and integrated high gain, high speed photodetector. This unit is 8-lead DIP. The output of the detector circuit is an open collector, Schottky clamped transistor. A Faraday shield integrated on the photodetector chip reduces the effects of capacitive coupling between the input LED emitter and the high gain stages of the detector. This provides an effective common mode transient immunity of 1000 V/μs. • Input current threshold: IF = 5 mA (max) • Switching speed: 10MBd (typ.) • Common mode transient immunity: ±1000 V/μs (min) • Guaranteed performance over temperature: 0 to 70°C • Isolation voltage: 2500 Vrms (min) • UL recognized: UL1577, file no. E67349 Truth Table (positive logic) Input Output H L L H A 0.01 to 0.1μF bypass capacitor must connected between pins 8 and 5(see Note 1). Pin Configuration (top view) VCC 1 2 3 4 GND 8 7 6 5 1 : Anode 1 2 : Cathode 1 3 : Cathode 2 4 : Anode 2 5 : GND 6 : VO2 (Output 2) 7 : VO1 (Output 1) 8 : VCC Shield Schematic VF1 VF2 IF1 IF2 ICC VCC VO1 VO2 GND + − − + 1 2 3 4 8 7 6 5 IO1 IO2 Shield Unit: mm TOSHIBA 11−10C4 Weight: 0.54 g (typ.) TLP2631 2007-10-01 2 Absolute Maximum Ratings (no derating required up to 70°C) Characteristic Symbol Rating Unit Forward current (each channel) IF 20 mA Pulse forward current (each channel)* IFP 30 mA LE D Reverse voltage (each channel) VR 5 V Output current (each channel) IO 16 mA Output voltage (each channel) VO −0.5~7 V Supply voltage (1 minute maximum) VCC 7 V D et ec to r Output collector power dissipation (each channel) PO 40 mW Operating temperature range Tstg −55~125 °C Storage temperature range Topr −40~85 °C Lead soldering temperature (10s)** Tsol 260 °C Isolation voltage (AC, 1 min., R.H.≤ 60%, Note 3) BVS 2500 Vrms Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). * t ≤ 1 msec duration. ** 2mm below seating plane. Recommended Operating Conditions Characteristic Symbol Min Typ. Max Unit Input current, low level, each channel IFL 0 ― 250 μA Input current, high level, each channel IFH 6.3* ― 20 mA Supply voltage**, output VCC 4.5 5 5.5 V Fan out (TTL load, each channel) N ― ― 8 Operating temperature Topr 0 ― 70 °C Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. *6.3mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value is 5.0mA or less. **This item denotes operating ranges, not meaning of recommended operating conditions. TLP2631 2007-10-01 3 Electrical Characteristics (Ta = 0~70°C unless otherwise noted) Characteristic Symbol Test Condition Min. Typ. * Max. Unit Input forward voltage (each channel) VF IF = 10mA, Ta = 25°C ― 1.65 1.75 V Input diode temperature coefficient (each channel) ΔVF / ΔTa IF = 10mA ― −2.0 ― mV / °C Input reverse breakdown voltage (each channel) BVR IR = 10μA, Ta = 25°C 5 ― ― V Input capacitance (each channel) CT VF = 0, f = 1MHz ― 45 ― pF High level output current (each channel) IOH VCC = 5.5V, VO = 5.5V IF = 250μA ― 1 250 μA Low level output voltage (each channel) VOL VCC = 5.5V, IF = 5mA IOL(sinking) = 13mA ― 0.4 0.6 V High level supply current (both channels) ICCH VCC = 5.5V, IF = 0 ― 14 30 mA Low level supply current (both channels) ICCL VCC = 5.5V, IF = 10mA ― 24 38 mA Isolation voltage RS VS = 500V, R.H. ≤ 60% (Note 3) 5×10 10 1014 ― Ω Capacitance (input−output) CS f = 1MHz (Note 3) ― 0.6 ― pF Input−input leakage current II−I R.H. ≤ 60%, t = 5s VI−I = 500V (Note 6) ― 0.005 ― μA Resistance (input−input) RI−I VI−I = 500V (Note 6) ― 1011 ― Ω Capacitance (input−input) CI−I f = 1MHZ (Note 6) ― 0.25 ― pF * All typical values are at VCC = 5V, Ta = 25°C. TLP2631 2007-10-01 4 Switching Characteristics (Ta = 25°C, VCC = 5V) Characteristic Symbol Test Circuit Test Condition Min. Typ. Max. Unit Propagation delay time to low output level tpHL 1 IF = 0→7.5mA, RL = 350Ω CL = 15pF (each channel) ― 60 75 ns Propagation delay time to high output level tpLH 1 IF = 7.5mA→0, RL = 350Ω CL = 15pF (each channel) ― 60 75 ns Output rise time, output fall time (10~90%) tr, tf 1 IF = 0 7.5mA, RL = 350Ω CL = 15pF (each channel) ― 30 ― ns Common mode transient immunity at high output level CMH 2 IF = 0, RL = 350Ω VCM = 400V, VO(min.) = 2V (each channel, Note 4) 1000 10000 ― V / μs Common mode transient immunity at low output level CML 2 IF = 7.5mA, RL = 350Ω VCM = 400V VO(max.) = 0.8V (each channel, Note 5) −1000 −10000 ― V / μs (Note 1) 2mm below seating plane (Note 2) The VCC supply voltage to each TLP2631 isolator must be bypassed by a 0.01μF capacitor or larger. This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins each device. (Note 3) Device considered a two−terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted together. (Note 4) CMH･the maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e., VOUT > 2.0V). Measured in volts per microsecond (V / μs). Volts/ microsecond can be translated to sinusoidial voltages: (p.p.)CMV CMfMax.dt (dVCM) μsV / == Example: VCM = 319Vpp when fCM = 1MHz using CML and CMH = 1000V / μs data sheet specified minimum. (Note 5) CML･the maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state (i.e., VOUT > 0.8V). Measured in volts per microsecond (V / μs). (Note 6) Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together. TLP2631 2007-10-01 5 Test Circuit 1. tpHL and tpLH Test Circuit 2. Transient Immunity And Typical Waveforms. )(=,)(= μsrt 320(V) LCMμsrt 320(V) HCM * CL is approximately 15pF which includes probe and stray wiring capacitance. VCC 1 2 3 4 GND 8 7 6 5 5V RL CL 350Ω 10 0Ω 0. 1μ F PW = 10μs Pulse input Duty cycle = 1/10 IF Monitor * CL is approximately 15pF which includes probe and stray wiring capacitance. VO Monitor IF VO VOL 1.5V 0.5V 4.5V 5V tr tf tpHL tpLH 7.5mA 3.75mA 0mA VCC 1 2 3 4 GND 8 7 6 5 5V RL CL 350Ω0. 1μ F ZO = 50Ω Pulse generator VO Monitor IF VFF VCM A B + − VCM VO VOL 5V 0.8V 0V tr tf 2V 400V VO (IF = 0mA) (IF = 7.5mA) 90% 10% TLP2631 2007-10-01 6 IF – VF Forward voltage VF (V) Fo rw ar d cu rre nt I F (m A ) 100 0.01 1.0 2.0 0.1 1 10 1.2 1.4 1.6 1.8 Ta = 25 °C ΔVF / ΔTa – IF Forward current IF (mA) Fo rw ar d vo lta ge te m pe ra tu re co ef fic ie nt Δ V F / Δ Ta (m V / ° C ) −1.4 0.1 0.3 1 3 10 30 −1.6 −1.8 −2.0 −2.2 −2.4 −2.6 50 VO – IF Forward current IF (mA) O ut pu t v ol ta ge V O (V ) 8 6 4 2 0 0 1 2 3 4 5 6 VCC = 5 V Ta = 25 °C RL = 350Ω 1kΩ 4kΩ IOH – Ta Ambient temperature Ta (°C) H ig h le ve l o ut pu t c ur re nt I O H (μ A ) 1 0 3 5 10 30 50 100 10 20 30 40 50 60 70 IF = 250 μA VCC = 5.5 V VO = 5.5 V VO – IF Forward current IF (mA) O ut pu t v ol ta ge V O (V ) 8 6 4 2 0 0 1 2 3 4 5 6 10 Ta = 70°C 0°C VCC = 5 V RL = 350Ω RL = 4kΩ VOL – Ta Lo w le ve l o ut pu t v ol ta ge V O L ( V) Ambient temperature Ta (°C) 0.2 0 80 20 40 60 0.3 0.4 0.5 IF = 5 mA VCC = 5.5 V VE = 2 V IOL=16mA 12.8mA 6.4mA 9.6mA TLP2631 2007-10-01 7 tpHL, tpLH – IF Forward current IF (mA) P ro pa ga tio n de la y tim e t p H L, t p LH (n s) 120 0 5 19 7 9 11 13 15 17 20 40 60 80 100 RL = 4kΩ 1kΩ 350Ω 350Ω 1kΩ 4kΩ tpLH tpLH tpHL Ta = 25 °C VCC = 5 V tr, tf – Ta R is e, fa ll tim e t r, t f ( ns ) Ambient temperature Ta (°C) 0 70 20 40 60 80 10 20 30 40 50 60 280 300 320 0 VCC = 5 V IF = 7.5 mA RL = 4kΩ 1kΩ 350Ω 350Ω 1kΩ 4kΩ tf tf tf tr tpHL, tpLH – Ta Ambient temperature Ta (°C) P ro pa ga tio n de la y tim e t p H L, t p LH (n s) 0 70 120 0 20 40 60 80 100 10 20 30 40 50 60 RL = 4kΩ 1kΩ 350kΩ 1kΩ 4kΩ tpLH tpLH tpHL 350Ω VCC = 5 V IF = 7.5 mA TLP2631 2007-10-01 8 RESTRICTIONS ON PRODUCT USE • Toshiba Corporation, and its subsidiaries and affiliates (collectively “TOSHIBA”), reserve the right to make changes to the information in this document, and related hardware, software and systems (collectively “Product”) without notice. • This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with TOSHIBA’s written permission, reproduction is permissible only if reproduction is without alteration/omission. • Though TOSHIBA works continually to improve Product’s quality and reliability, Product can malfunction or fail. Customers are responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage to property, including data loss or corruption. Before creating and producing designs and using, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the precautions and conditions set forth in the “TOSHIBA Semiconductor Reliability Handbook” and (b) the instructions for the application that Product will be used with or for. Customers are solely responsible for all aspects of their own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications. 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Unintended Use includes, without limitation, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for automobiles, trains, ships and other transportation, traffic signaling equipment, equipment used to control combustions or explosions, safety devices, elevators and escalators, devices related to electric power, and equipment used in finance-related fields. Do not use Product for Unintended Use unless specifically permitted in this document. • Do not disassemble, analyze, reverse-engineer, alter, modify, translate or copy Product, whether in whole or in part. • Product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any applicable laws or regulations. • The information contained herein is presented only as guidance for Product use. 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No license to any intellectual property right is granted by this document, whether express or implied, by estoppel or otherwise. • ABSENT A WRITTEN SIGNED AGREEMENT, EXCEPT AS PROVIDED IN THE RELEVANT TERMS AND CONDITIONS OF SALE FOR PRODUCT, AND TO THE MAXIMUM EXTENT ALLOWABLE BY LAW, TOSHIBA (1) ASSUMES NO LIABILITY WHATSOEVER, INCLUDING WITHOUT LIMITATION, INDIRECT, CONSEQUENTIAL, SPECIAL, OR INCIDENTAL DAMAGES OR LOSS, INCLUDING WITHOUT LIMITATION, LOSS OF PROFITS, LOSS OF OPPORTUNITIES, BUSINESS INTERRUPTION AND LOSS OF DATA, AND (2) DISCLAIMS ANY AND ALL EXPRESS OR IMPLIED WARRANTIES AND CONDITIONS RELATED TO SALE, USE OF PRODUCT, OR INFORMATION, INCLUDING WARRANTIES OR CONDITIONS OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, ACCURACY OF INFORMATION, OR NONINFRINGEMENT. • GaAs (Gallium Arsenide) is used in Product. GaAs is harmful to humans if consumed or absorbed, whether in the form of dust or vapor. Handle with care and do not break, cut, crush, grind, dissolve chemically or otherwise expose GaAs in Product. • Do not use or otherwise make available Product or related software or technology for any military purposes, including without limitation, for the design, development, use, stockpiling or manufacturing of nuclear, chemical, or biological weapons or missile technology products (mass destruction weapons). Product and related software and technology may be controlled under the Japanese Foreign Exchange and Foreign Trade Law and the U.S. Export Administration Regulations. Export and re-export of Product or related software or technology are strictly prohibited except in compliance with all applicable export laws and regulations. • Please contact your TOSHIBA sales representative for details as to environmental matters such as the RoHS compatibility of Product. Please use Product in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances, including without limitation, the EU RoHS Directive. TOSHIBA assumes no liability for damages or losses occurring as a result of noncompliance with applicable laws and regulations. TOSHIBA photocoupler GaAℓAs IRed & Photo IC Truth Table (positive logic) Pin Configuration (top view) Schematic Absolute Maximum Ratings (no derating required up to 70°C) Recommended Operating Conditions Electrical Characteristics (Ta = 0~70°C unless otherwise noted) Switching Characteristics (Ta = 25°C, VCC = 5V) Test Circuit 1. tpHL and tpLH Test Circuit 2. Transient Immunity And Typical Waveforms.