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首页 5990-3442EN使用安捷伦测试RFID.pdf

5990-3442EN使用安捷伦测试RFID.pdf

5990-3442EN使用安捷伦测试RFID.pdf

上传者: zhaokuiman 2011-12-16 评分 0 0 0 0 0 0 暂无简介 简介 举报

简介:本文档为《5990-3442EN使用安捷伦测试RFIDpdf》,可适用于工程科技领域,主题内容包含IntroductionRFIDs,alsocallednoncontactICcardsorIDtags,aredevicesthatmakeit符等。

IntroductionRFIDs,alsocallednoncontactICcardsorIDtags,aredevicesthatmakeitpossibletodetectthepresenceofobjectsandverifytheiridentificationwithoutcontactingthemRFIDshavebeenusedsincethe’sbutinitiallytheirusewaslimitedtomaritimetransports,trafficinformationsystems,andotherspecialapplicationsSincethemiddleof’s,RFIDshavebeenminiaturizedatanacceleratedrateandtheyarenowwidelyusedCurrently,anumberofstandardsexistthatdefinethefrequencies,communicationmethods,andpurposesofRFIDsThisdocumentgivesanoverviewofhowtoevaluatetheelectricalcharacteristicsofmassproducedMHzRFIDtagsandreaderswritersandtheircomponentsOverviewofanRFIDFigureshowsasimplifiedRFIDsystemTheloopantennainthereaderwritercommunicateswiththeloopantennaintheRFIDtagtheseareelectromagneticallycoupledThereaderwriteroutputsRFsignals,whicharereceivedbytheRFIDtagviaitsloopantennaTheRFIDtaggainspowerbydetectingDCsignalsthroughadetectorcircuitintegratedinitsICchipThispowerisusedtodrivetheICchipTypically,datacommunicationsbetweenreaderswritersandRFIDtagsuseASKmodulationatafrequencyofMHzUsingaNetworkandImpedanceAnalyzertoEvaluateMHzRFIDTagsandReadersWritersApplicationNoteFigureSimplifiedRFIDsystem#"#"!"!!!"!#"#"!""""!!#"""!""!"$"!!""!""#"!"!!"FigureRFIDtagcomponentsanditsequivalentcircuitFigureManufacturingprocessofRFIDtagsFigureshowsatypicalmanufacturingprocessofcardtypeRFIDtagsThisprocessinvolvesprintingorotherwiseformingaloopantennaonthecardandsubsequentlyplacinganICchipandchipcapacitoronthesamecardPrintingmayalsobeusedtoformthecapacitoronthecardFinally,thetagisappropriatelypackagedandtestedbeforeshippingFigureisacircuitdiagramwhichrepresentsacompletedRFIDtagBasically,anRFIDtagconsistsofanLCRparallelcircuit(where“L”standsforaloopantenna,“C”forachipcapacitor,and“R”foranICchip)TheresonantfrequencyofanRFIDtag,f,isgivenbytheexpression(πLC)IfanRFIDtaghasaresonantfrequencyclosetoMHz,thentheRFIDtagisconsideredtocommunicatewellwithareaderwriterItisveryimportanttoverifythatthecompletedtaginitsentiretyresonatesatMHzAlso,measuringthecharacteristicsofLandCcomponentpartswillhelpimprovetheyieldofcompletedRFIDtagsAnotherconsiderationisthesharpnessofresonance(communicationbandwidth),whichisdeterminedbytheRvalueoftheICchiportheparasiticresistance,“R”,oftheloopantennaAnexcessivelyhighsharpnessofresonancemakescommunicationsdifficultwhenthemodulationsignalbandwidthiswideontheotherhand,anexcessivelylowsharpnessofresonanceresultsinworsenedcommunicationdistancecharacteristicsItisimportanttomeasuretheresonancecharacteristicsofthecompletedtaginitsentirety,andmeasuringtheseresistancevaluesonapartbypartbasiswillhelpimprovethecommunicationperformanceoftheRFIDtagfπ…$EvaluatingRFIDTagsFigureRecommendedinstrumentsandaccessoriesBasiccomponentsofL,C,andRmakeupanRFIDtagaswellastheRFportionofareaderwriterTheAimpedanceanalyzerisanoptimumchoiceformeasuringtheelectricalcharacteristicsofthesecomponentsYoumayalsowanttousetheAcombinationanalyzerwhichcombinesanimpedance,network,andspectrumanalyzerinasingleboxIfyoudonotneedthewideimpedancemeasurementrangeprovidedbyanimpedanceanalyzeryoucanuseanetworkanalyzerinsteadRFIDtagsdonothavecoaxialconnectors,instead,manyoftheircomponentshaveelectrodesorleadterminalsTherefore,youshoulduseatestfixturethatmatchestheshapeofthetagtoconnecttheRFIDtagundertesttotheanalyzerIftheRFIDtaghasaloopantennaformedonthecard,youshoulduseaprobetoconnectthetagtotheanalyzerComponentLevelMeasurementsAprecisionimpedanceanalyzerAimpedanceprobekitForaxialleadcomponentsForSMDcomponentsChooseanappropriatetestfixturealongwiththeDUTdimensionAimpedanceprobekitforAAAimpedanceanalyzerorAcombinationanalyzerARFimpedancetestkitpinprobepinprobe()foreitherAornetworkanalyzersAcombinationanalyzerARFimpedancetestkitEAENAnetworkanalyzerECENAnetworkanalyzerAgilentsolutionimpedancemeasurementinstrumentsAgilentsolutionimpedancemeasurementtestfixturesAgilentsolutionimpedancemeasurementprobesFigureshowsexamplesofmeasurementscarriedoutonachipcapacitorandaloopantennaThetwographsindicatethatthechipcapacitorandloopantennaresonateatapproximatelyMHzandMHz,respectivelyEachofthesecomponentscanonlybeusedatorbelowtheresonantfrequenciesindicatedAlso,theresultsobtainedatMHzforthesecomponentsare:C=approximatelypFandL=approximatelyuHThesevaluesdeterminetheresonantfrequenciesAftertestingeachcomponent,youcanuseaprobetomeasuretheresonancecharacteristicsoftheentireRFIDtagcompletewithallitscomponentsFigureExamplesofmeasurementsFigureRFIDmeasurementwithimpedanceprobeMHzMHzSelfresonanceSelfresonanceExample:ChipcapacitorcharacteristicsmeasuredwiththeAExample:LoopantennacharacteristicsmeasuredwiththeAFigureNoncontactmeasurementsofresonantfrequenciesFigureHighpowerconfigurationofENAnetworkanalyzerNonContactMeasurementsofResonantFrequenciesOnceanRFIDtagispackaged,youcannottestitwithaprobeYoucan,however,useanoncontactmeasuringmethodInthismethodyouholdanRFIDtaginfrontofaloopantennaconnectedtoananalyzerThisallowsyoutomeasuretheresonantfrequencyofanRFIDtagwithouthavingtodisassembletheRFIDtagNoncontactmeasurementsaretypicallycarriedoutwithanetworkanalyzer,whichprovideshighermeasuringspeedsthanothertypesofanalyzersThenoncontactmethodmakesitpossibletoperformresonantfrequencymeasurementsonallRFIDtagsduringthefinalstageofmassproductionTheresonancecharacteristicsofcertainRFIDtagsmaychangedependingontheRFpowertheyreceivefromtheanalyzerTheENAnetworkanalyzerisanoptimumchoicewhenyouneedahigherpowerduringmeasurementsYoucanconnecttheENAnetworkanalyzerwithanexternalamplifierorsimilarcircuittoproduceahigherpowerthantheanalyzeritselfcanoutputAlso,theENAnetworkanalyzerprovidesafunctioncalled“PowerMeterCalibration”thatallowsyoutoaccuratelysettheRFpowerlevelwhenperformingmeasurementsFigureisasimplifiedcircuitdiagramofanRFIDreaderwriterTheimpedanceofthepoweramplifiercontainedinareaderwritershouldmatchthatoftheloopantennasothatthepoweramplifiercaneffectivelytransmitthepowertotheloopantennaWhenthepoweramplifier’soutputimpedance(Zpa)isRjX,youshouldadjusttheloopantenna’simpedance(Zin)toRjXAtypicalsettingis:Zpa=Zin=ΩThegoalistodeterminethecapacitorsvaluesbyadjustingvaluesonbothCsandCptoachieveimpedancematchingYoushouldconnectcapacitorstotheloopantennainserialorparallel,andadjustthecapacitancevaluesofthesecapacitorssothatimpedancematchingisachievedItiscommonpracticetouseananalyzerorsimulatorprograminSmithChartmodewhilemeasuringandadjustingthecapacitancevaluesofthesecapacitorsEvaluatingaReaderWriterFigureSimplifiedcircuitdiagramofanRFIDreaderwriter##!$#"!!#!!!''!FigureDesignintegrationwithGenesysAimpedanceanalyzerEAnetworkanalyzerAcombinationanalyzerECnetworkanalyzerGenesysCoreIntegratingananalyzerwithAgilentGenesysCoresoftwareprovidesanalysisfunctionsbeyondthebuiltinanalyzerfunctionsWhenyourdesiredanalysisisnotavailableonyouranalyzer,youcanuseaninexpensivesoftwaresimulationprogramcalledGenesysCoreEasilyperformvarioustypesofmeasurementanalysisbytransferringmeasurementresultstoGenesysCoreinstalledonaPCForexample,theAimpedanceanalyzerisnotabletodisplayaSmithchart,butyoucangenerateonebyjusttransferringmeasurementresultstoGenesysCoreNote:TheEA,EC,andAanalyzerscomewithbuiltinSmithChartmodeForexample,supposeyoumeasurethecharacteristicsofaloopantennawithoutamatchingcircuitusingyouranalyzerYoucanthentransferthemeasurementresultstoGenesystosimulatehowtheloopantennawouldbehavewhencoupledwithacertainmatchingcircuitThusthesimulatorprogramallowsyoutoestimatewhatcharacteristicswillbeobtainedwitheachofpossiblecircuitconfigurationwithouthavingtocreatedifferentmatchingcircuitsbyrepeatedlyrebuildingtheactualcircuitBycombininganimpedanceanalyzerwithGenesys,youcanalsoperformdifferenttypesofanalysisontheelectricalcharacteristicsofRFIDtagsandreaderswritersRelatedliteratureNonContactmeasurementmethodofMHzRFIDusingtheENAENALApplicationNote,ENGenesysSoftwarehttp:eesoftmagilentcomproductsgenesys,*'*"**()*$,*'*"**("(#,*"**("#()"")"*"(()"")"**"",)"")"")"*#"*"**("(#),"*"#*!,**$"*"""**)(""),"!*"'#"*"**(!"*,("!)*$FigureMatchingcircuitsimulationusingGenesyswwwagilentcomfindemailupdatesGetthelatestinformationontheproductsandapplicationsyouselectwwwagilentcomfindagilentdirectQuicklychooseanduseyourtestequipmentsolutionswithconfidencewwwagilentcomwwwagilentcomfindENAFormoreinformationonAgilentTechnologies’products,applicationsorservices,pleasecontactyourlocalAgilentofficeThecompletelistisavailableat:wwwagilentcomfindcontactusAmericasCanada()LatinAmericaUnitedStates()AsiaPacificAustraliaChinaHongKongIndiaJapan()KoreaMalaysiaSingaporeTaiwanThailandEuropeMiddleEastAustriaBelgium()DenmarkFinland()France**minuteGermanyIrelandIsraelItalyNetherlands()Spain()SwedenSwitzerlandUnitedKingdom()OtherEuropeanCountries:wwwagilentcomfindcontactusRevised:October,ProductspecificationsanddescriptionsinthisdocumentsubjecttochangewithoutnoticeAgilentTechnologies,IncPrintedinUSA,February,ENRemovealldoubtOurrepairandcalibrationserviceswillgetyourequipmentbacktoyou,performinglikenew,whenpromisedYouwillgetfullvalueoutofyourAgilentequipmentthroughoutitslifetimeYourequipmentwillbeservicedbyAgilenttrainedtechniciansusingthelatestfactorycalibrationprocedures,automatedrepairdiagnosticsandgenuinepartsYouwillalwayshavetheutmostconfidenceinyourmeasurementsAgilentoffersawiderangeofadditionalexperttestandmeasurementservicesforyourequipment,includinginitialstartupassistance,onsiteeducationandtraining,aswellasdesign,systemintegration,andprojectmanagementFormoreinformationonrepairandcalibrationservices,goto:wwwagilentcomfindopenAgilentOpensimplifiestheprocessofconnectingandprogrammingtestsystemstohelpengineersdesign,validateandmanufactureelectronicproductsAgilentoffersopenconnectivityforabroadrangeofsystemreadyinstruments,openindustrysoftware,PCstandardIOandglobalsupport,whicharecombinedtomoreeasilyintegratetestsystemdevelopmentwwwlxistandardorgLXIistheLANbasedsuccessortoGPIB,providingfaster,moreefficientconnectivityAgilentisafoundingmemberoftheLXIconsortiumwwwagilentcomfindremovealldoubt

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