www.irf.com 1
7/9/03
IRF7831
HEXFET��Power MOSFET
Notes���through � are on page 10
Benefits
� Very Low RDS(on) at 4.5V VGS
� Ultra-Low Gate Impedance
� Fully Characterized Avalanche Voltage
and Current
Applications
� High Frequency Point-of-Load
Synchronous Buck Converter for
Applications in Networking &
Computing Systems.
Top View
81
2
3
4 5
6
7
D
D
D
DG
S
A
S
S
A
SO-8
����������
VDSS RDS(on) max Qg (typ.)
30V 3.6m�@VGS = 10V 40nC
Absolute Maximum Ratings
Parameter Units
VDS Drain-to-Source Voltage V
VGS Gate-to-Source Voltage
ID @ TA = 25°C Continuous Drain Current, VGS @ 10V
ID @ TA = 70°C Continuous Drain Current, VGS @ 10V A
IDM Pulsed Drain Current �
PD @TA = 25°C Power Dissipation � W
PD @TA = 70°C Power Dissipation �
Linear Derating Factor W/°C
TJ Operating Junction and °C
TSTG Storage Temperature Range
Thermal Resistance
Parameter Typ. Max. Units
RθJL Junction-to-Drain Lead ––– 20 °C/W
RθJA Junction-to-Ambient � ––– 50
-55 to + 150
2.5
0.02
1.6
Max.
21
17
170
± 12
30
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2 www.irf.com
Static @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units
BVDSS Drain-to-Source Breakdown Voltage 30 ––– ––– V
∆ΒVDSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.025 ––– V/°C
RDS(on) Static Drain-to-Source On-Resistance 2.5 3.1 3.6 mΩ
3.0 3.7 4.4
VGS(th) Gate Threshold Voltage 1.35 ––– 2.35 V
∆VGS(th) Gate Threshold Voltage Coefficient ––– - 5.7 ––– mV/°C
IDSS Drain-to-Source Leakage Current ––– ––– 1.0 µA
––– ––– 150
IGSS Gate-to-Source Forward Leakage ––– ––– 100 nA
Gate-to-Source Reverse Leakage ––– ––– -100
gfs Forward Transconductance 97 ––– ––– S
Qg Total Gate Charge ––– 40 60
Qgs1 Pre-Vth Gate-to-Source Charge ––– 12 –––
Qgs2 Post-Vth Gate-to-Source Charge ––– 3.1 ––– nC
Qgd Gate-to-Drain Charge ––– 11 –––
Qgodr Gate Charge Overdrive ––– 14 ––– See Fig. 16
Qsw Switch Charge (Qgs2 + Qgd) ––– 14 –––
Qoss Output Charge ––– 22 ––– nC
td(on) Turn-On Delay Time ––– 18 –––
tr Rise Time ––– 10 –––
td(off) Turn-Off Delay Time ––– 17 ––– ns
tf Fall Time ––– 5.3 –––
Ciss Input Capacitance ––– 6240 –––
Coss Output Capacitance ––– 980 ––– pF
Crss Reverse Transfer Capacitance ––– 390 –––
Avalanche Characteristics
Parameter Units
EAS Single Pulse Avalanche Energy � mJ
IAR Avalanche Current � A
Diode Characteristics
Parameter Min. Typ. Max. Units
IS Continuous Source Current ––– ––– 2.5
(Body Diode) A
ISM Pulsed Source Current ––– ––– 170
(Body Diode)��
VSD Diode Forward Voltage ––– ––– 1.2 V
trr Reverse Recovery Time ––– 42 62 ns
Qrr Reverse Recovery Charge ––– 31 47 nC
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Conditions
Max.
100
16
ƒ = 1.0MHz
Conditions
VGS = 0V, ID = 250µA
Reference to 25°C, ID = 1mA
VGS = 10V, ID = 20A �
MOSFET symbol
VDS = 16V, VGS = 0V
VDD = 15V, VGS = 4.5V �
ID = 16A
VDS = 15V
VGS = 12V
VGS = -12V
VDS = 24V, VGS = 0V
TJ = 25°C, IF = 16A, VDD = 25V
di/dt = 100A/µs �
TJ = 25°C, IS = 16A, VGS = 0V �
showing the
integral reverse
p-n junction diode.
VGS = 4.5V, ID = 16A �
VGS = 4.5V
Typ.
–––
VDS = VGS, ID = 250µA
Clamped Inductive Load
VDS = 15V, ID = 16A
VDS = 24V, VGS = 0V, TJ = 125°C
–––
ID = 16A
VGS = 0V
VDS = 15V
�������
www.irf.com 3
Fig 4. Normalized On-Resistance
Vs. Temperature
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
0.01
0.1
1
10
100
1000
I D
,
D
ra
in
-
to
-
So
u
rc
e
Cu
rr
e
n
t (A
)
2.25V
20µs PULSE WIDTH
Tj = 25°C
VGS
TOP 10V
5.0V
4.5V
3.5V
3.0V
2.7V
2.5V
BOTTOM 2.25V
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
0.1
1
10
100
1000
I D
,
D
ra
in
-
to
-
So
u
rc
e
Cu
rr
e
n
t (A
)
2.25V
20µs PULSE WIDTH
Tj = 150°C
VGS
TOP 10V
5.0V
4.5V
3.5V
3.0V
2.7V
2.5V
BOTTOM 2.25V
2.0 2.5 3.0 3.5 4.0
VGS, Gate-to-Source Voltage (V)
0.1
1.0
10.0
100.0
1000.0
I D
,
D
ra
in
-
to
-
So
u
rc
e
Cu
rr
e
n
t
(Α
)
TJ = 25°C
TJ = 150°C
VDS = 15V
20µs PULSE WIDTH
-60 -40 -20 0 20 40 60 80 100 120 140 160
TJ , Junction Temperature (°C)
0.5
1.0
1.5
2.0
R
D
S(
o
n
) ,
D
ra
in
-
to
-
So
u
rc
e
O
n
R
e
si
st
a
n
ce
(N
o
rm
a
liz
e
d)
ID = 20A
VGS = 10V
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4 www.irf.com
Fig 8. Maximum Safe Operating Area
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
Fig 7. Typical Source-Drain Diode
Forward Voltage
1 10 100
VDS, Drain-to-Source Voltage (V)
100
1000
10000
100000
C,
Ca
pa
ci
ta
n
ce
(pF
)
Coss
Crss
Ciss
VGS = 0V, f = 1 MHZ
Ciss = Cgs + Cgd, C ds SHORTED
Crss = Cgd
Coss = Cds + Cgd
0 20 40 60 80 100
QG Total Gate Charge (nC)
0
2
4
6
8
10
12
V G
S,
G
a
te
-
to
-
So
u
rc
e
Vo
lta
ge
(V
) VDS= 24V
VDS= 15V
ID= 12A
0.2 0.4 0.6 0.8 1.0 1.2
VSD, Source-toDrain Voltage (V)
0.1
1.0
10.0
100.0
1000.0
I S
D
,
R
e
ve
rs
e
D
ra
in
Cu
rr
e
n
t (A
)
TJ = 25°C
TJ = 150°C
VGS = 0V
0.1 1.0 10.0 100.0 1000.0
VDS , Drain-toSource Voltage (V)
1
10
100
1000
I D
,
D
ra
in
-
to
-
So
u
rc
e
Cu
rr
e
n
t (A
)
Tc = 25°C
Tj = 150°C
Single Pulse
1msec
10msec
OPERATION IN THIS AREA
LIMITED BY R DS(on)
100µsec
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www.irf.com 5
1E-006 1E-005 0.0001 0.001 0.01 0.1 1 10 100
t1 , Rectangular Pulse Duration (sec)
0.001
0.01
0.1
1
10
100
Th
e
rm
a
l R
e
sp
o
n
se
( Z
th
JA
) 0.20
0.10
D = 0.50
0.02
0.01
0.05
SINGLE PULSE
( THERMAL RESPONSE )
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthja + Tc
τJ
τJ
τ1
τ1
τ2
τ2 τ3
τ3
R1
R1 R2
R2 R3
R3
C
Ci= τi/Ri
τC
τ4
τ4
R4
R4
τ5
τ5
R5
R5 Ri (°C/W) τi (sec)
0.514 0.000182
2.445 0.030949
20.64 0.36354
17.80 6.99
8.604 109
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
Fig 9. Maximum Drain Current Vs.
Case Temperature
Fig 10. Threshold Voltage Vs. Temperature
-75 -50 -25 0 25 50 75 100 125 150
TJ , Temperature ( °C )
1.0
1.2
1.4
1.6
1.8
2.0
2.2
2.4
V G
S(
th
) G
a
te
th
re
sh
o
ld
Vo
lta
ge
(V
)
ID = 250µA
25 50 75 100 125 150
TJ , Junction Temperature (°C)
0
4
8
12
16
20
24
I D
,
D
ra
in
Cu
rr
e
n
t (A
)
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6 www.irf.com
D.U.T. VDS
IDIG
3mA
VGS
.3µF
50KΩ
.2µF12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-
Fig 13. Gate Charge Test Circuit
Fig 12b. Unclamped Inductive Waveforms
Fig 12a. Unclamped Inductive Test Circuit
tp
V(BR)DSS
IAS
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
RG
IAS
0.01Ωtp
D.U.T
LVDS
+
-
VDD
DRIVER
A
15V
20VVGS
25 50 75 100 125 150
Starting TJ, Junction Temperature (°C)
0
100
200
300
400
500
E A
S,
Si
n
gl
e
Pu
ls
e
Av
a
la
n
ch
e
En
e
rg
y
(m
J)
I D
TOP
11A
13A
BOTTOM
16A
Fig 14a. Switching Time Test Circuit
Fig 14b. Switching Time Waveforms
VGS
VDS
90%
10%
td(on) td(off)tr tf
VGS
Pulse Width < 1µs
Duty Factor < 0.1%
VDD
VDS
LD
D.U.T
+
-
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www.irf.com 7
Fig 15. �
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P.W. Period
di/dt
Diode Recovery
dv/dt
Ripple ≤ 5%
Body Diode Forward Drop
Re-Applied
Voltage
Reverse
Recovery
Current
Body Diode Forward
Current
VGS=10V
VDD
ISD
Driver Gate Drive
D.U.T. ISD Waveform
D.U.T. VDS Waveform
Inductor Curent
D = P.W.Period
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Fig 16. Gate Charge Waveform
Vds
Vgs
Id
Vgs(th)
Qgs1 Qgs2 Qgd Qgodr
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Control FET
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P
loss
= P
conduction
+ P
switching
+ P
drive
+ P
output
This can be expanded and approximated by;
Ploss = Irms
2 × Rds(on )( )
+ I ×
Qgd
ig
× Vin × f
+ I ×
Qgs 2
ig
× Vin × f
+ Qg × Vg × f( )
+ Qoss
2
×Vin × f
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Synchronous FET
The power loss equation for Q2 is approximated
by;
Ploss = Pconduction + Pdrive + Poutput
*
Ploss = Irms
2
× Rds(on)( )
+ Qg × Vg × f( )
+ Qoss
2
× Vin × f
+ Qrr × Vin × f( )
*dissipated primarily in Q1.
For the synchronous MOSFET Q2, Rds(on) is an im-
portant characteristic; however, once again the im-
portance of gate charge must not be overlooked since
it impacts three critical areas. Under light load the
MOSFET must still be turned on and off by the con-
trol IC so the gate drive losses become much more
significant. Secondly, the output charge Q
oss
and re-
verse recovery charge Q
rr
both generate losses that
are transfered to Q1 and increase the dissipation in
that device. Thirdly, gate charge will impact the
MOSFETs’ susceptibility to Cdv/dt turn on.
The drain of Q2 is connected to the switching node
of the converter and therefore sees transitions be-
tween ground and Vin. As Q1 turns on and off there is
a rate of change of drain voltage dV/dt which is ca-
pacitively coupled to the gate of Q2 and can induce
a voltage spike on the gate that is sufficient to turn
the MOSFET on, resulting in shoot-through current .
The ratio of Qgd/Qgs1 must be minimized to reduce the
potential for Cdv/dt turn on.
Power MOSFET Selection for Non-Isolated DC/DC Converters
Figure A: Q
oss
Characteristic
�������
www.irf.com 9
SO-8 Package Details
SO-8 Part Marking
e 1
D
E
y
b
A
A1
H
K
L
.189
.1497
0°
.013
.050 BASIC
.0532
.0040
.2284
.0099
.016
.1968
.1574
8°
.020
.0688
.0098
.2440
.0196
.050
4.80
3.80
0.33
1.35
0.10
5.80
0.25
0.40
0°
1.27 BASIC
5.00
4.00
0.51
1.75
0.25
6.20
0.50
1.27
MIN MAX
MILLIMETERSINCHES
MIN MAX
DIM
8°
e
c .0075 .0098 0.19 0.25
.025 BASIC 0.635 BASIC
8 7
5
6 5
D B
E
A
e6X
H
0.25 [.010] A
6
7
K x 45°
8X L 8X c
y
0.25 [.010] C A B
e1
A
A18X b
C
0.10 [.004]
431 2
FOOTPRINT
8X 0.72 [.028]
6.46 [.255]
3X 1.27 [.050]
4. OUTLINE CONFORMS TO JEDEC OUTLINE MS-012AA.
NOTES :
1. DIMENS IONING & TOLERANCING PER ASME Y14.5M-1994.
2. CONTROLLING DIMENS ION: MILLIMETER
3. DIMENS IONS ARE SHOWN IN MILLIMETERS [INCHES].
5 DIMENS ION DOES NOT INCLUDE MOLD PROTRUSIONS.
6 DIMENS ION DOES NOT INCLUDE MOLD PROTRUSIONS.
MOLD PROTRUS IONS NOT TO EXCEED 0.25 [.010].
7 DIMENS ION IS THE LENGTH OF LEAD FOR SOLDERING TO
A SUBSTRATE.
MOLD PROTRUS IONS NOT TO EXCEED 0.15 [.006].
8X 1.78 [.070]
EXAMPLE: THIS IS AN IRF7101 (MOSFET)
INTERNATIONAL
RECTIFIER
LOGO
F7101
YWW
XXXX
PART NUMBER
LOT CODE
WW = WEEK
Y = LAST DIGIT OF THE YEAR
DATE CODE (YWW)
�������
10 www.irf.com
����
��Repetitive rating; pulse width limited by
max. junction temperature.
� �Starting TJ = 25°C, L = 0.76mH
RG = 25Ω, IAS = 16A.
� Pulse width ≤ 400µs; duty cycle ≤ 2%.
� When mounted on 1 inch square copper board
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.7/03
330.00
(12.992)
MAX.
14.40 ( .566 )
12.40 ( .488 )
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. OUTLINE CONFORMS TO EIA-481 & EIA-541.
FEED DIRECTION
TERMINAL NUMBER 1
12.3 ( .484 )
11.7 ( .461 )
8.1 ( .318 )
7.9 ( .312 )
NOTES:
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
SO-8 Tape and Reel
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