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F930_EMIreport.pdf

F930_EMIreport

chopper 2011-09-19 评分 0 浏览量 0 0 0 0 暂无简介 简介 举报

简介:本文档为《F930_EMIreportpdf》,可适用于IT/计算机领域,主题内容包含ENGINEERINGTESTREPORTNUMBER:EEUONModelNo(s):CFTBINACCORDANCEWITH:EN:EN:TES符等。

ENGINEERINGTESTREPORTNUMBER:EEUONModelNo(s):CFTBINACCORDANCEWITH:EN:EN:TESTEDFOR:SiliconLaboratoriesBostonLaneAustin,TXTESTEDBY:NemkoUSA,IncNKealyLewisville,TexasTotalPagesAPPROVEDBY:DATE:BrianBoyea,EMCEngineerAPPROVEDBY:DATE:ArturoRuvalcaba,EMCEngineerNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofTableofContentsSectionSummaryofTestResultsGeneral:Abstract:SectionEquipmentUnderTest(EUT)DescriptionofEUT:ModificationsIncorporatedinEUT:Justification:ExerciseProgram:EUTPhotographs:SectionEquipmentConfigurationEquipmentConfigurationList:SectionRadiatedEmissionsPurpose:TestData–RadiatedEmissions,ElectricField,Test#REHESectionElectrostaticDischargeImmunityTestData–ElectrostaticDischargeTest#ESDISectionRadiatedElectromagneticImmunityTestData–RadiatedElectromagneticFieldTest#RIHESectionTestMethodsandBlockDiagramsSectionPerformanceCriteriaNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofSectionSummaryofTestResultsGeneral:AllmeasurementsaretraceabletonationalstandardsThesetestswereconductedonasampleoftheequipmentforthepurposeofdemonstratingcompliancewiththefollowingstandards:•EN:,Genericstandards–Immunityforresidential,commercial,andlightindustrialenvironments•EN:,Genericstandards–Emissionstandardforresidential,commercial,andlightindustrialenvironmentsAlltestswereperformedusingmeasurementprocedureCISPRFrequencieswereinitiallyidentifiedinasemianechoicchamberAmplitudemeasurementsweremadeinasemianechoicchamberDetailsofthechamberareonfilewiththeFCCandIndustryCanadaRequirementsandtestsusingthefollowingstandardsastestmethodologies:Abstract:NameofTestBasicStandardResultsConductedEmissions(Mainsport)EN:(CISPR)NTRadiatedEmissionsEN:(CISPR)CompliesHarmonicsEN:NTFlickerEN:NTNT:NotTestedTheEUTwastestedincellandcellmodesNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofAbstract:ContinuedImmunities:NameofTestBasicStandardTestSpecificationResultsElectrostaticDischargeEN:kVContactDischargekVAirDischargeCompliesRadiatedElectromagneticFieldEN:MHztoMHzAMkHzVmCompliesElectricalFastTransientsBurstEN:kVonIOSignalandControlLineskVonPowerSupplyNTSurgeImmunityEN:IOSurgekVLinetoEarthkVLinetoLinekVNTRFConductedImmunityEN:kHztoMHzVrmsModNTMagneticImmunityEN:AMHz,Hz(ForCRTAM)NTVoltageDipsandInterruptionsEN:Reduction(ms)Reduction(ms)<Reduction(s)NTNT:NotTestedTheEUTwastestedincellandcellmodesNemkoUSA,Incauthorizestheabovenamedcompanytoreproducethisreportprovideditisreproducedinitsentirety,forusebythecompany’semployeesonlyAnyusewhichathirdpartymakesofthisreport,oranyrelianceonordecisionstobemadebasedonit,aretheresponsibilityofsuchthirdpartiesNemkoUSA,Incacceptsnoresponsibilityfordamages,ifany,sufferedbyanythirdpartyasaresultofdecisionsmadeoractionsbasedonthisreportThisreportappliesonlytotheitemstestedanddoesnotconstituteendorsementbytheUnitedStatesofAmericaTHEFOLLOWINGDEVIATIONSFROM,ADDITIONSTO,OREXCLUSIONSFROMTHETESTSPECIFICATIONSHAVEBEENMADE:NONENemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofSectionEquipmentUnderTest(EUT)Manufacturer:SiliconLaboratoriesName:CFTBModelNumber:CFTBSerialNumber:NoneProvidedPartNumber:CFTBProductionStatus:PRODUCTIONDescriptionofEUT:TheDKisthedevelopmentkitandtheTBistheTargetBoardTheTBgoesintheDKTheFisanotherformoftheFjustwithfewerfeaturesClockFrequencies:SystemClock=MHz,LEDBlinkFrequency=HzModificationsIncorporatedinEUT:TheEUThasnotbeenmodifiedfromwhatisdescribedbythebrandnameanduniquetypeidentificationstatedaboveNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofJustification:TheEUTwasconfiguredfortestingaspertypicalinstallationPositionandbundlingofcableswereinvestigatedtoestablishmaximumamplitudeofemissionsThefollowingcombinationswereinvestigatedtoestablishworstcaseconfiguration:DemoMode,TurnonSwandEUTisexecutingcodeTheEUTwastestedincellandcellmodesExerciseProgram:TheEUTexerciseprogramusedduringradiatedandconductedtestingwasdesignedtoexercisethevarioussystemcomponentsinamannersimilartotypicaluseTheEUTwasinthefollowingexercisemode:TurnonSwandEUTisexecutingcodePerformanceCriteria:CriteriaA:TheapparatusshallcontinuetooperateasintendedNodegradationofperformanceorlossoffunctionisallowedbelowaperformancelevelspecifiedbythemanufacturer,whentheapparatusisusedasintendedTheperformancelevelmaybereplacedbypermissiblelossofperformanceIftheminimumperformancelevelorthepermissibleperformancelossisnotspecifiedbythemanufacturertheneitherofthesemaybederivedfromtheproductdescriptionanddocumentationandwhattheusermayreasonablyexpectfromtheapparatusifusedasintendedCriteriaB:TheapparatusshallcontinuetooperateasintendedafterthetestNodegradationofperformanceorlossoffunctionisallowedbelowaperformancelevelspecifiedbythemanufacturer,whentheapparatusisusedasintendedTheperformancelevelmaybereplacedbyapermissiblelossofperformanceDuringthetest,degradationofperformanceishoweverallowedNochangeofactualoperatingstateorstoreddataisallowedIftheminimumperformancelevelorthepermissibleperformancelossisnotspecifiedbythemanufacturertheneitherofthesemaybederivedfromtheproductdescriptionanddocumentationandwhattheusermayreasonablyexpectfromtheapparatusifusedasintendedCriteriaC:Temporarylossoffunctionisallowed,providedthefunctionisselfrecoverableorcanberestoredbytheoperationofthecontrolsNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofEUTPhotographs:NemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofSectionEquipmentConfigurationEquipmentConfigurationList:Date:NEMKOUSEONLYJOB#:Company:EQUIPMENTCONFIGURATIONLIST(HARDWAREPERIPHERALS):Placean"*"nexttoEUTandanyitemthatispartoftheEUTItem*Rev(A)*(B)(C)(D)(E)(F)(G)(H)(I)(J)(K)(L)FCCIDSTATUSFCCDOCNone(IfperformingFCCtesting,contactlabmanager)FCCABVerificationCertification(includeFCCIDinparenthesis)INTERCONNECTIONCABLES:Placean"*"nexttoEUTandanyitemthatispartoftheEUTItem*Ln(m)TermQty()()()()()()()()()()()()()TERMINATIONPeripheralResistiveLoopbackRemoteEquipmentEUTOtherCableTypeManufacturerShieldNoneCFTBSiliconLaboratoriesCFTBNAESiliconLaboratories,IncGenericDescriptionManufacturerModelNoSerial#FCCIDStatusNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofSectionRadiatedEmissionsPurpose:ThetestisintendedtodemonstratethecomplianceoftheEquipmentUnderTest(EUT)tothelimitsforradiateddisturbanceasdefinedbyEN:SpecificationLimits:LimitsforradiatedemissionsFrequencyrange(MHz)QuasipeakLimitsdB(µµµµVm)mUnderconsiderationTestMethod:SeeSectionTestInformation:TestConditions:Test#:REHETestVoltage:VdcTestedBy:BrianBoyeaTemperature:CDateofTests:Humidity:TestResults:TheEUTdoescomplyTESTEQUIPMENTAssetNumberDescriptionManufacturerModelNumberSerialNumberLastCalCalDueAntennabilogSchaffnerCBLDCableAssy,mChamberNemkoChamberNAPREAMP,dBNemkoLNAmChamberNemkoSpectrumAnalyzerRohdeSchwarzFSPNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofTestData–RadiatedEmissions,ElectricField,Test#REHECELLNemkoENClassAMHzGHzHorizontalScanMMMMMFrequency(Hz)LimitLevel(dBuVm)Company:SiliconLabsModelNumber:::PM,Thursday,February,Operator:BRIANBOYEAScanENALimitScanPeaksPeaksNemkoENClassAMHzGHzVerticalScanMMMMMFrequencyAmplitude(dbuVm)Company:SiliconLabsModelNumber:::PM,Thursday,February,Operator:BRIANBOYEAScanENALimitScanPeaksPeaksNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofNemko,Lewisville,TXFCCMeterChamberFinalQuasiPeakMeasurementsOperator:BRIANBOYEAModelNumber:CFTBCellCompany:SiliconLabs::PM,Thursday,February,FrequencyLimitHorizontalQPVerticalVerticalMHzLimitQPMarginQPMarginNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofTestData–RadiatedEmissions,ElectricField,Test#REHECELLNemkoENClassAMHzGHzHorizontalScanMMMMMFrequency(Hz)LimitLevel(dBuVm)Company:SiliconLabsModelNumber:::AM,Friday,February,Operator:BRIANBOYEAScanENALimitScanPeaksPeaksNemkoENClassAMHzGHzVerticalScanMMMMMFrequencyAmplitude(dbuVm)Company:SiliconLabsModelNumber:::AM,Friday,February,Operator:BRIANBOYEAScanENALimitScanPeaksPeaksNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofNemko,Lewisville,TXFCCMeterChamberFinalQuasiPeakMeasurementsOperator:BRIANBOYEAModelNumber:CFTBCellJ:EnqsYREMCESICISPRAREMhzGhzcellAutoQPTIL::AM,Friday,February,Company:SiliconLabsFrequencyLimitHorizontalQPVerticalVerticalMHzLimitQPMarginQPMarginNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofTestPhotographsTest#REHENemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofSectionElectrostaticDischargeImmunityPurpose:ThetestisintendedtodemonstratethecomplianceoftheEquipmentUnderTest(EUT)toelectrostaticsdischargesMinimumPerformanceCriteriaBTestMethod:SeeSectionTestInformation:TestConditions:Test#:ESDITestVoltage:VdcTestedBy:BrianBoyeaTemperature:CDateofTests:Humidity:TestResults:TheEUTcompliesTheEUTmeetsPerformanceCriteriaBTESTEQUIPMENTAssetNumberDescriptionManufacturerModelNumberSerialNumberLastCalCalDueESDEMCPartnerESDESDRelayModuleEMCPartnerESDRMOHMGROUNDSTRAPNemkoUSA,IncNONENONECBUNAESDDNEMCPartnerESDDNNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofTestData–ElectrostaticDischargeTest#ESDIElectrostaticDischargeDataCompleteXJob#:ETest#:ESDIPreliminaryPageofClientName:SiliconLaboratoriesEUTName:CFDKEUTModel#:CFDKEUTPart#:CFDKEUTSerial#:EUTConfig:TurnedonSWandEUTisexecutingcodeCellandCellSpecification:ENReference:ENESDGenerator#:Temp(degC):Date:Cable#:Humidity():Time::PMEUTVoltage:VdcStaff:BrianBoyeaHCPXEUTFrequency:HzPhotoID:EESDIVCPXPhase:SinglePerformanceCriteria:BLocation:LabTableToporFloorTableDoesproducthaveanytypeofinsulatedcoatingonexteriorsurfacesYesNoxIfyes,indicatewhere:TestESDPolarityContactApplicationEffectEffectsPassPointLevelorQuantityQtyTypeor(kV)AirFailComments()ContactNAPass()ContactNAPass()ContactNAPass()ContactNAPassEMCShareAUTOMATEDATASHTSESDRevCxlsDocumentControl#EMCDSIMESDNemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofTestPhotographsTest#ESDINemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofSectionRadiatedElectromagneticImmunityPurpose:ThetestisintendedtodemonstratethecomplianceoftheEquipmentUnderTest(EUT)toradiatedelectromagneticfieldenergyMinimumPerformanceCriteriaATestMethod:SeeSectionTestInformation:TestConditions:Test#:RIHETestVoltage:VdcTestedBy:BrianBoyeaTemperature:CDateofTests:Humidity:TestResults:TheEUTcompliesTheEUTmeetsPerformanceCriteriaATESTEQUIPMENTAssetNumberDescriptionManufacturerModelNumberSerialNumberLastCalCalDueCABLE,mNemkoRGNACABLE,mNemkoRGNALogAntennaARATCNRCNRSignalGeneratorRSSMIQISOTROPICFIELDPROBEARFPSpectrumanalyzerdisplayHewlettPackardBAFieldMonitorETSLindgrenHICNRNARFPowerAmplifierOPHIRCNRNANemkoUSA,IncEN:EN:REPORTNO:EEUEQUIPMENT:CFTBPageofTestData–RadiatedElectromagneticFieldTest#RIHERadiatedImmunityElectricFieldTestDataCompleteXJob#:ETest#:RIHEPreliminaryPageofClientName:SiliconLaboratoriesEUTName:CFDKEUTModel#:CFDKEUTPart#:CFDKEUTSerial#:EUTConfig:Turned

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