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B051105 EMI TEST REPORT.pdf

B051105 EMI TEST REPORT

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2011-09-19 0人阅读 0 0 0 暂无简介 举报

简介:本文档为《B051105 EMI TEST REPORTpdf》,可适用于IT/计算机领域

PageofEMCTechnologiesPtyLtdABNUnit,SuccessStreetAcaciaRidgeQueenslandAustraliaTelephoneFacsimileEmailbrisbaneemctechcomauMelbourneAssemblyDriveTullamarineVicTel:Fax:SydneyUnitStationRoadSevenHillsNSWTel:Fax:BrisbaneUnitSuccessStreetAcaciaRidgeQldTel:Fax:Auckland(NZ)MacKelvieStreetGreyLynnAucklandTel:Fax:EMITESTREPORTReportNoBManufacturer:RinstrumPtyLtdTestSample:DandDremotedisplaysModels:DandDSerialNumber:andDateofIssue:thDecemberEMCTechnologiesPtyLtdreportsapplyonlytothespecificsamplestestedunderstatedtestconditionsAllsamplestestedwereingoodoperatingconditionthroughouttheentiretestprogramItisthemanufacturer’sresponsibilitytoensurethatadditionalproductionunitsofthismodelaremanufacturedwithidenticalelectricalandmechanicalcomponentsEMCTechnologiesPtyLtdshallhavenoliabilityforanydeductionsinferencesorgeneralisationsdrawnbytheclientorothersfromEMCTechnologiesPtyLtdissuedreportsThisreportshallnotbeusedtoclaim,constituteorimplyproductendorsementbyEMCTechnologiesPtyLtdThetests,calibrationsormeasurementscoveredbythisdocumenthavebeenperformedinaccordancewithNATArequirementswhichincludetherequirementsofISOIECandaretraceabletonationalstandardsofmeasurementThisdocumentshallnotbereproduced,exceptinfullNATAAccreditedLaboratoryNumber:Thetestsforradiatedimmunity(EN),harmonics(EN)andflicker(EN)wereperformedatourSydneyLaboratory,UnitStationRoad,SevenHillsNSWTel:Fax:*ENandENarenotwithinEMCTechnologies’scopeofNATAaccreditationEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdCertificateofComplianceEMCTechnologiesReportNo:BTestSampleName:DandDRemoteDisplaysModels:DandDSerialNumber:andPartNumber:NoneManufacturer:RinstrumPtyLtdSuccessStreet,AcaciaRidge,QldAustraliaTestedFor:RinstrumPtyLtdAddress:SuccessStreet,AcaciaRidge,QldAustraliaPhone:Fax:ResponsibleOfficer:MrKenBrayTestStandards:EN:,IncludingAmdt:,Amdt:andAmdt:Electricalequipmentformeasurement,controlandlaboratoryuseResultofTest:ThetestsamplecompliedwithrequirementsofEN:,IncludingAmdts,Theresultforconductedemissionsisinsidethelaboratory’smarginofuncertaintyRefertoReportBforfulldetailsTestDates:,,,,,,andTestingOfficers:AdamGallagherMichaelEvansAuthorisedSignature:MichaelEvansBranchManagerEMCTechnologiesPtyLtdIssuedbyEMCTechnologiesPtyLtd,UnitSuccessStreet,AcaciaRidge,Qld,,AustraliaPhone:Fax:wwwemctechcomauEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdPartSummaryofEMCTestsontheDandDRemoteDisplays,ManufacturedByRinstrumPtyLtdINTRODUCTIONThisreportdetailstheresultsofthetestperformedontheDandDRemoteDisplays,Models:DandDSUMMARYofRESULTSEmissions–ENConductedEMI:Complieswithamarginofatleast*dBRadiatedEMI:ComplieswithamarginofatleastdB**Thisresultfallswithinthelaboratory’smeasurementuncertaintyImmunity–ENENImmunitytoElectrostaticDischargeComplies,BENImmunitytoRadiatedElectromagneticFieldsComplies,AENImmunitytoElectricalFastTransientsComplies,BENSurgeImmunityComplies,AENImmunitytoConductedDisturbancesComplies,AENImmunitytoMagneticFieldsNotapplicableENImmunitytoVoltageDipsandInterruptionsComplies,AENThistestwasperformedatourSydneylaboratory,seeReportinAppendixCENThistestwasperformedatourSydneylaboratory,seeReportinAppendixCEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdDESCRIPTIONTestSampleTheEquipmentUnderTest(EUT)wasidentifiedasfollows:Manufacturer:RinstrumPtyLtdTestSample:DandDRemoteDisplaysModels:DandDSerialNumber:andModificationsNomodificationswereperformedTestSetUpTheEUTwastestedinaccordancewiththerequirementsofEN,IncludingAmdts,andAppendixD,CustomerTestPlanBlockDiagramD(EUT)D(EUT)WeightIndicatorVacScreenedtwistedpaircableVacVacEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdPartEmissionsTestsonDandDRemoteDisplays,inaccordancewithEN,IncludingAmdts,INTRODUCTIONElectromagneticInterference(EMI)testswereperformedontheDandDRemoteDisplays,Models:DandD,testedonbehalfofRinstrumPtyLtd,inaccordancewiththerequirementsofEN,includingAmdts,SUMMARYConductedEMI:Complieswithamarginofatleast*dBRadiatedEMI:ComplieswithamarginofatleastdB*Thisresultfallswithinthelaboratory’smeasurementuncertaintyRESULTSConductedEMIResultsDLEDDisplayFreqMHzLineQPdBµVQPLimitdBµV∆QPLimitdBAVdBµVAVLimitdBµV∆AVLimitdBActive*Active*Active*NeutralNeutralNeutralActiveNeutralActiveNeutral*Thismeasurementiswithinthelaboratory’smeasurementuncertaintyAllmeasuredfrequenciescompliedwiththeClassBquasipeakandaveragelimitsbymarginsofatleastdBandatleast*dBrespectivelyThemeasurementuncertaintyforconductedemissionsis±dBRefertoAppendixB,GraphsandEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdConductedEMIResults–DFlipFlopDisplayFreqMHzLineQPdBµVQPLimitdBµV∆QPLimitdBAVdBµVAVLimitdBµV∆AVLimitdBNeutral*Neutral*ActiveNeutralNeutralActiveNeutralActiveActiveActive*Thismeasurementiswithinthelaboratory’smeasurementuncertaintyAllmeasuredfrequenciescompliedwiththeClassBquasipeakandaveragelimitsbymarginsofatleast*dBandatleastdBrespectivelyThemeasurementuncertaintyforconductedemissionsis±dBRefertoAppendixB,GraphsandRadiatedEMIResultsFrequencyMHzPolarisationQPdBµVmLimitdBµVm∆LimitdBVerticalVerticalVerticalVerticalVerticalVerticalVerticalAllmeasuredfrequenciescompliedwiththeClassBquasipeaklimitbyamarginofatleastdBThemeasurementuncertaintyforradiatedemissionsis±dBRefertoAppendixB,GraphsandCONCLUSIONSTheDandDRemoteDisplays,Models:DandD,testedonbehalfofRinstrumPtyLtd,complieswiththeClassBconductedandradiatedradiodisturbancerequirementsofEN,includingAmdts,Theresultforconductedimmunityisinsidethelaboratory’smarginofuncertaintyEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdPartImmunityTestingontheDandDRemoteDisplays,inaccordancewithEN,IncludingAmdts,INTRODUCTIONThisreportisintendedtodocumenttheconformanceoftheDandDRemoteDisplays,Models:DandD,withtheElectromagneticCompatibilityrequirementsofEN,includingAmdts,SUMMARYofTESTRESULTSENImmunitytoElectrostaticDischargeComplies,BENImmunitytoRadiatedElectromagneticFieldsComplies,AENImmunitytoElectricalFastTransientsComplies,BENSurgeImmunityComplies,AENImmunitytoConductedDisturbancesComplies,AENMagneticFieldImmunityNotApplicableENImmunitytoVoltageDipsandInterruptionsComplies,AREGULATIONSANDSTANDARDSAPPLIEDEN:,IncludingAmdts,Electricalequipmentformeasurement,controlandlaboratoryuse–EMCrequirementsEN:ElectromagneticCompatibilityPart:TestingandMeasuringTechniquesSection:ElectrostaticdischargeimmunitytestEN:,IncludingAmdtElectromagneticCompatibilityPart:TestingandMeasuringTechniquesSection:Radiated,radiofrequency,electromagneticfieldimmunitytestEN:ElectromagneticCompatibilityPart:TestingandMeasuringTechniquesSection:ElectricalfasttransientburstimmunitytestEN:ElectromagneticCompatibilityPart:TestingandMeasuringTechniquesSection:SurgeimmunitytestEN:ElectromagneticCompatibilityPart:TestingandMeasuringTechniquesSection:Immunitytoconducteddisturbances,inducedbyradiofrequencyfieldsEN:ElectromagneticCompatibilityPart:TestingandMeasuringTechniquesSection:PowerfrequencymagneticfieldimmunitytestEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdEN:ElectromagneticCompatibilityPart:TestingandMeasuringTechniquesSection:Voltagedips,shortinterruptionsandvoltagevariationsimmunitytestPERFORMANCECRITERIACriterionATheEUTshallcontinuetooperateasintendedduringthetestingCriterionBTheEUTshallcontinuetooperateasintendedafterthetestItmayhoweverexceeditsdesignspecificationsduringtestTemporarylossoffunctionispermittedprovidedthatthisisselfrecoverableCriterionCTemporarylossoffunctionispermittedprovidedthatthisisselfrecoverableorcanberestoredbytheoperationofcontrolsegNormaloperationresumesafterapowerdownpoweroncycleNopermanentdamageistobesustainedCriterionDDegradationorlossoffunction,whichisnotrecoverableduetodamagetoequipment,components,softwareorlossofdataTestPassFailElectrostaticDischargeCriterionAorBCriteriaCorDRadiatedRFFieldsGSMCriterionACriteriaB,CorDElectricalFastTransientsCriterionAorBCriteriaCorDHighVoltageSurgesCriterionAorBCriteriaCorDConductedDisturbancesCriterionACriteriaB,CorDVoltageDipsInterruptionsCriterionAorBCriteriaCorDEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdTESTRESULTSIMMUNITYENImmunitytoElectrostaticDischargeTestProcedureThistestwasperformedasperEMCTechnologiestestprocedureTPandENAminimumoftendischargeswereappliedateachlevelandpolarityESDwasonlyappliedtotheD(LED)DisplayattherequestoftheclientTestClimaticConditionsShieldedRoomTemperature:°CRelativeHumidity:DischargePointsIndirectcontactdischargeswereappliedtothehorizontalcouplingplane(HCP)atonepointoneachofthefoursidesoftheEUTIndirectcontactdischargeswereappliedtotheverticalcouplingplane(VCP)withtheVCPplacedalongeachofthefoursidesoftheunitDirectcontactdischargeswereappliedtothefollowingpoints:ScrewonRHSScrewonRHSScrewonRHSScrewonRHSPlateonRHSBracketonTopplateTopofcaseTopofcaseTopofcaseFrontofcaseFrontofcaseFrontofcaseScrewonLHSScrewonLHSScrewonLHSScrewonLHSMiddleofLHSRearofcaseRearofcaseRearofcaseBottomofcaseBottomofcaseBottomofcaseRefertopictureonnextpagefordischargepointsEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdDirectairdischargeswerenotappliedastheEUTwasmadeofmetalanddischargestothegrommetsandfrontscreendischargedtothemetalcasewhichiscoveredinthecontacttestaboveResultsAirDischargeAirDischargesLevelVoltageResultInsulatingSurfaces±kVNodischargesInsulatingSurfaces±kVNodischargesInsulatingSurfaces±kVNodischargesConclusion:TheEUTisametalcaseanydischargesaroundtheplasticgrommetsandfrontdisplaygostraighttothemetalcaseandwerethereforetestedunderthecontactdischargetestbelowTheEUTcompliedwiththeCriterionArequirementsofENEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdContactDischargeContactDischargesLevelVoltageResultHorizontalCouplingPlane±kVCompliesAHorizontalCouplingPlane±kVCompliesAVerticalCouplingPlane±kVCompliesAVerticalCouplingPlane±kVCompliesADirect±kVCompliesADirect±kVCompliesBConclusion:NoeffectTheEUTcompliedwiththeCriterionBrequirementsofENEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdENImmunitytoRadiatedElectromagneticFieldsThistestwasperformedatourSydneylaboratory,seeReportinAppendixCEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdENImmunitytoElectricalFastTransientsTestProcedureThistestwasperformedasperEMCTechnologiestestprocedureTPandENElectricalFastTransientswereonlyappliedtotheD(LED)DisplayattherequestoftheclientTestClimaticConditionsShieldedRoomTemperature:°CRelativeHumidity:MainsCables:PortInjectionMethodLevelVoltageRepetitionRateResultMainsportCouplingDecouplingNetwork±kVkHzSeeCodeMainsportCouplingDecouplingNetwork±kVkHzSeeCodeMainsportCouplingDecouplingNetwork±kVkHzSeeCodeCode:TheandcharacterschangedbrieflytwiceduringthekVtestsConclusion:EffectswerenotedTheEUTcompliedwiththeCriterionBrequirementsofENSignalCables:PortInjectionMethodLevelVoltageRepetitionRateResultRSPortCouplingDecouplingNetworkX±kVkHzCompliesARSPortCouplingDecouplingNetwork±kVkHzCompliesARSPortCouplingDecouplingNetwork±kVkHzCompliesAConclusion:NoeffectTheEUTcompliedwiththeCriterionArequirementsofENEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdENSurgeImmunityTestProcedureThistestwasperformedasperEMCTechnologiestestprocedureTPandENasaninstallationclassSurgeImmunitywasonlyappliedtotheD(LED)DisplayattherequestoftheclientTestClimaticConditionsShieldedRoomTemperature:°CRelativeHumidity:ResultsPortCableInjectionModeLevelVoltageResultMainsportLLX±kVCompliesAMainsportLL±kVCompliesAMainsportLL±kVCompliesAMainsportL,LPE±kVCompliesAMainsportL,LPE±kVCompliesAMainsportL,LPE±kVCompliesAConclusion:NoeffectTheEUTcompliedwiththeCriterionArequirementsofENEMCTestReportNoBPageofThisdocumentmustnotbecopiedorreproduced,exceptinfull,withoutthewrittenpermissionoftheManager,EMCTechnologiesPtyLtdENImmunitytoConductedDisturbancesTestProcedureThistestwasperformedasperEMCTechnologiestestprocedureTPandENThedwelltimeateachfrequencywassecondswithasteprateofofthefundamentalfrequencyConductedImmunitywasonlyappliedtotheD(LED)DisplayattherequestoftheclientTestClimaticCondit

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